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Nano sizer sz90

Manufactured by Malvern Panalytical
Sourced in United Kingdom

The Nano-Sizer SZ90 is a particle size analyzer designed for the measurement of particle size and size distribution in nanometer and sub-micron ranges. The instrument utilizes dynamic light scattering (DLS) technology to determine the hydrodynamic size of particles suspended in a liquid medium. The Nano-Sizer SZ90 can measure particle sizes ranging from 0.3 nm to 10 μm.

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3 protocols using nano sizer sz90

1

Characterization of SiO2 Nanoparticles

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The sample for transmission electron microscope (TEM) examination was prepared by placing the dispersed SiO2-NPS on a carbon-coated copper grid and left for drying at room temperature before being characterized via TEM instrument (JEOL 200 kV, Tokyo, Japan). The particle size and zeta potential of SiO2-NPs in its colloidal solution and after submission for 15 min of sonication were assessed using particle size analyzer (Nano-Sizer SZ90, Malvern instruments Ltd., Cambridge, UK). The size distribution and zeta potential of the as prepared SiO2-NPs was measured at pH = 7 and 25 °C. Scanning Electron Microscopy (SEM; JEOL, JSM-6360LA, Tokyo, Japan) instrument was used to investigate the internal structure and surface morphology of SiO2-NPS. X-ray diffraction (XRD) analysis was performed to examine the crystallinity and the specific peaks for the formed SiO2-NPs using an XRD device (Panalytical Emperian, Istanbul, Turkey) having CuKa radiation and operating with 40 kV and a 2-theta range of 10–80.
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2

Comprehensive Physicochemical Characterization of SiO2@AgNPs

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To examine the prepared sample with the Transmission electron microscope (TEM), the sample of SiO2@AgNPs was deposited in on a “carbon-coated copper grid” and was left for drying at room temperature followed by the characterization through the TEM instrument (JEOL 200 kV, Japan). The Nano-Sizer SZ90 (Malvern instruments Ltd., UK) was used to evaluate the “particle size” and the “zeta potential” of the formed SiO2@AgNPs in powder form. The size distribution and zeta potential of the as prepared SiO2@AgNPs were calculated at a pH of 7 and a temperature of 25 °C. Scanning electron microscopy (SEM) (JEOL, JSM-6360LA, Japan) was used to illustrate the internal structure and surface morphology of the SiO2@AgNPs. X-ray diffraction (XRD) analysis was performed to check the crystallinity and the specific peaks of the formed SiO2@AgNPs via the “XRD sate of art Panalytical Emperian, Turkey” pertaining to the CuKa radiation and was operated with a power of 40 kV and a 2-theta range of 10–80.
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3

Zeta Potential Analysis of Propolis and Alg NPs

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Dynamic light scattering (DLS) was used to determine the zeta potentials of propolis, Alg NPs, and propolis–Alg NPs (Nano-Sizer SZ90, Malvern Instruments, UK). The average value was calculated after measuring the aqueous NP suspension samples three times [65 ].
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