Jem 1400 flash
The JEM-1400 Flash is a compact and versatile transmission electron microscope (TEM) designed for high-resolution imaging and analysis. It features a LaB6 electron source, providing a stable and reliable electron beam. The microscope is capable of operating at an accelerating voltage of up to 120 kV, enabling the imaging of a wide range of sample types. The JEM-1400 Flash is equipped with advanced features to support various applications in materials science, nanotechnology, and life sciences.
Lab products found in correlation
7 protocols using jem 1400 flash
Ultrastructural Characterization of Fusarium Wilt
Ultrastructural Analysis of Fusarium TR4
Transmission Electron Microscopy of Lung Tissues
Ultrastructural Analysis of Fusarium oxysporum f. sp. cubense Mycelia
Morphological Analysis of Foc TR4 Cells
Comprehensive Material Characterization
and elemental composition of the materials was characterized by field
emission scanning electron microscopy (FE-SEM; Hitachi-S4800) and
transmission electron microscopy (TEM; JEM 1400 flash). Specific surface
area was analyzed on a surface area analyzer (TriStar 3000 V6.07 A)
using N2 adsorption/desorption isotherms at 77 K. The pore
size distribution and total pore volume of the samples were estimated
through the Barrett–Joyner–Halenda (BJH) method. X-Ray
diffraction (XRD) patterns were recorded using an X-ray diffractometer
(Bruker D2). The surface chemical functional groups of the samples
were characterized by Fourier transform infrared spectroscopy (FTIR-4600
Jasco in the region of 400–4000 cm–1). Raman
spectra (RS) were recorded using an Xplora Plus (Horiba) microscope.
Multimodal Nanostructure Characterization
Each sample was fixed to a double-sided tape on a carrier table and then gold-plated onto the surface. The surface morphology of each sample was observed by a Scanning Electron Microscope (SEM) (Regulus 8230, Hitachi, Japan) at an operating voltage of 20 Each sample solution diluted and added dropwise to a freshly prepared smooth and flat mica sheet, and then it was left to dried at room temperature. The morphology of each sample was further observed using an atomic force microscope (AFM) (Dimension Fastscan, Bruker, Germany) at the scanning frequency of 1 Hz (Wang, Gan, Li, Nirasawa, & Cheng, 2019) (link).
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