Morphology and size of the nanocrystals in developed dispersions were analyzed using an NTEGRA Prima Atomic Force Microscope (NT-MDT, Moscow, Russia). The sample preparation included dilution of the dispersion F5, F6, or F8 in ultra-purified water (1:100 v/v), after which the 10 µL of the sample was placed on the circular mica substrate (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, CA, USA) and dried in a vacuum dryer (30 min, 25 °C). The measurements were conducted using intermittent-contact AFM mode using NT-MDT NSGO1 silicon cantilevers (N-type, Antimony doped, Au reflective coating), with a nominal force constant of 5.1 N/m. The cantilever driving frequency was around 150 kHz during the measurements. For the analysis of the taken topography and “error signal” AFM images, the software Image Analysis 2.2.0 (NT-MDT) was used.
Ntegra prima atomic force microscope
Manufactured by NT-MDT
The NTEGRA prima atomic force microscope is a research-grade instrument designed for high-resolution imaging and analysis of surface topography at the nanoscale. It utilizes the principles of atomic force microscopy to provide detailed information about the physical characteristics of a wide range of materials and samples.
Automatically generated - may contain errors
Lab products found in correlation
Highest grade v1 afm mica discs, by Ted Pella (5 mentions)
Nsgo1 silicon cantilevers, by NT-MDT (2 mentions)
Nsgo1 rectangular silicon cantilevers, by NT-MDT (2 mentions)
Image analysis 2, by NT-MDT (2 mentions)
Ultimate 4 x ray diffractometer, by Rigaku (1 mentions)
Tecnai g2 spirit transmission electron microscope, by Thermo Fisher Scientific (1 mentions)
Sd r150 t3l450b 10, by Nanosensors (1 mentions)
Nsg01 cantilevers, by NT-MDT (1 mentions)
8 protocols using ntegra prima atomic force microscope
1
Nanocrystal Morphology Analysis via AFM
2
Nanoemulsion Morphology Characterization using AFM
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A drop (10 µL) of sample—nanoemulsion diluted in ultra-pure water in 1:1000, v/v ratio—was deposited onto circular mica plate (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, CA, USA) and dried under vacuum in order to remove the excess of water. Detailed investigation of the morphology of the samples, as well as of the shape, distribution and size of the droplets was accomplished with NTEGRA prima atomic force microscope (NT-MDT). Due to the fragility of the thin layers of the AFM samples, intermittent-contact AFM mode was implemented. For this purpose, NT-MDT NSGO1 rectangular silicon cantilevers with Au reflective film were used. Nominal resonant frequency of these cantilevers is 150 kHz, while nominal force constant is 5.1 N/m. Image Analysis 2.2.0 (NT-MDT) software was implemented for processing of the obtained AFM data.
3
Characterization of GK-OCMC Nanoparticles
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X-ray diffraction (XRD) patterns of GK, OCMC, and GK–OCMC were acquired by a Rigaku Ultimate IV X-ray diffractometer scanned at speed of 5°/min with ranging from 5° to 80°. The particle size and zeta potential of the GK–OCMC Nps were determined using dynamic light scattering (DLS) with the Nano-ZS90 Malvern Zetasizer (Malvern, UK) in triplicate at 25°C. The morphology of the GK–OCMC Nps was observed under a Tecnai G2 Spirit transmission electron microscope (FEI, USA) after negative staining with 2% (w/v) phosphotungstic acid. Furthermore, the surface characteristics of the Nps were reconfirmed by the NTEGRA Prima atomic force microscope (Nt-Mdt, Zelenograd, Russia), while Nova RC1 software (V1.0.26.1138, Nt-Mdt, Russia) was used for formation of images.
4
Atomic Force Microscopy Analysis of Emodin's Effect on Biofilm
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The effect of the compound on biofilm morphology and structure was analysed by AFM. Samples were prepared by adding 1 ml of bacterial suspension (10 6 CFU/ml) into wells that contained previously placed cover glasses on the bottom. After 24 h of incubation, the culture medium was removed, a fresh medium containing emodin (concentration 4 × MIC) was added and the plates were incubated for 24 h. The next day, the samples were gently rinsed in 1 × PBS (phosphate buffered saline), air-dried and glued to microscopic slides. Afterwards, AFM analysis of the samples was performed with the NTEGRA prima atomic force microscope (NT-MDT). Intermittent-contact AFM mode was applied using NT-MDT NSGO1 silicon, N-type, antimony doped cantilevers with Au reflective coating. The nominal force constant of the cantilevers is 5.1 N/m, whereas the cantilevers driving frequency was around 150 kHz. AFM images were created and analysed with the software Image Analysis 2.2.0 (NT-MDT).
5
Atomic Force Microscopy Characterization of Cell Cytoskeleton
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The NTEGRA Prima atomic force microscope (NT-MDT Spectrum Instruments, Moscow, Russia) was used to capture images of cells and their cytoskeleton. The AFM 3D images were captured with NSG01 cantilevers that had a gold reflective surface, a 10 nm tip radius, and a spring constant range of 1.45–15.1 N/m (NT-MDT Spectrum Instruments, Russia). Scanning areas varied from 100 × 100 to 1 × 1 μm2 in semi-contact operation mode. The resolution of each image spanned between 512 and 1024 points [29 (link),30 (link)]. Image processing was performed using FemtoScan Online software, Version 2.3.239 (5.2) (Advanced Technologies Center, Moscow, Russia, www.nanoscopy.ru (accessed on 12 January 2023)) [31 (link),32 (link),33 (link),34 (link)].
To assess the Young’s modulus of native cell membranes, the SD-R150-T3L450B-10 cantilever series (Nanosensors, Neuchatel, Switzerland) was selected, with a tip radius of 150 nm, a resonance frequency of 21 kHz, and a stiffness coefficient of K = 1 N/m.
The cantilever series SD-R150-T3L450B-10 (Nanosensors, Switzerland) was used to measure the Young’s modulus of native cell membranes, with a probe radius of 150 nm, resonance frequency, and a stiffness coefficient of K = 1 N/m. All AFM images and force curves were made using SPM Nova software (NT-MDT Spectrum Instruments, Russia).
To assess the Young’s modulus of native cell membranes, the SD-R150-T3L450B-10 cantilever series (Nanosensors, Neuchatel, Switzerland) was selected, with a tip radius of 150 nm, a resonance frequency of 21 kHz, and a stiffness coefficient of K = 1 N/m.
The cantilever series SD-R150-T3L450B-10 (Nanosensors, Switzerland) was used to measure the Young’s modulus of native cell membranes, with a probe radius of 150 nm, resonance frequency, and a stiffness coefficient of K = 1 N/m. All AFM images and force curves were made using SPM Nova software (NT-MDT Spectrum Instruments, Russia).
6
Atomic Force Microscopy Characterization of Nanoemulsions
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To confirm the size measurements results and to visualize the morphology of the oil droplets in the nanoemulsions, atomic force microscopy (AFM) was employed using NTEGRA prima atomic force microscope (NT-MDT, Moscow, Russia). A drop (10 μL) of diluted nanoemulsion sample (1:100, v/v in ultra-pure water) was directly deposited onto circular mica substrate (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, California, USA) and dried in vacuum to remove excess water. Measurements were carried out with the AFM operating in an intermittent-contact mode in air. NT-MDT NSGO1 silicon, N-type, Antimony doped, with Au reflective coating, cantilevers were used with the following parameters: nominal force constant 5.1 N/m, resonance frequency 87-230 kHz, driving frequency 150 kHz, and the line scanning frequency 0.5 Hz. Post-acquisition processing of the obtained topography and "error signal" images was performed using the software Image Analysis 2.2.0 (NT-MDT, Moscow, Russia).
7
Atomic Force Microscopy of Nanosuspensions
8
Atomic Force Microscopy of Nanoparticle Emulsion
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For the atomic force microscopy, NE sample (diluted in ultra-pure water in 1:1000, v/v ratio) was placed onto mica plate (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, CA, USA) and dried under vacuum to remove the excess water. NTEGRA prima atomic force microscope (NT-MDT) was used to inspect the morphology, shape, size, and distribution of the NE droplets. The intermittent-contact AFM mode was used, due to the samples’ fragility. NT-MDT NSGO1 rectangular silicon cantilevers with Au-reflective film were used for this purpose. Nominal resonant frequency of these cantilevers is 150 kHz, while nominal force constant is 5.1 N/m. Image Analysis 2.2.0 (NT-MDT) software was used to process the obtained data.
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