Hp 34 401a multimeter

Fabrics are planar materials and, therefore, their electrical behaviour may be quantified by the surface (or sheet) resistance ( $R_s$ ) and characterized by the surface (or sheet) resistivity ( ${\rho }_s$ ). The conductivity of the integrated ground plane was characterized following the ASTM Standard F 1896—Test Method to Determine the Electrical Resistivity of a Printed Conductive Material [24 ]. In this standard process, first, the sheet resistance ( $R_s$ ) is measured using a resistance measuring electronic device. In this case, an Agilent HP 34,401A Multimeter was used, and the results are given in $\mathsf{\Omega }$ . Then, considering the sample dimensions, the sheet resistivity was calculated. Since the ${\rho }_s$ results are given in $\mathsf{\Omega }/square$ , the conductivity was further calculated by Equation (1),
$\sigma =\frac{1}{({\rho }_s·h)}$
where $\sigma$ is the conductivity, ${\rho }_s$ is the measured sheet resistivity and h is the thickness of the material. In this case, only the thickness of the conductive layer (0.043 mm, see Figure 5b) was considered.
Five samples of SIGP were measured under the environmental conditions of $20{}^{\circ }$ C $\pm 2^{\circ }$ and $65\%\pm 2\%$ of RH. Table 2 presents the test parameters and results.

The thin layer deposited samples were examined using both optical and confocal microscopes. The optical microscope Nikon MM-400 (Nikon Metrology, Brighton, USA) was used to visualize the sample and predetermine damage at the surface. Morphological observations of the samples were undertaken by means of a Carl Zeiss Ultra Plus field emission scanning electron microscope (Zeiss, Oberkochen, Germany). Both the surface and the cross section after coating fracture were evaluated. The conductivity of the samples was determined via four-probe method. An electric current (5–30 mA) was passed through collinear outer metal electrodes by a Keithley 2400 source meter (Keithley Instruments, Cleveland, USA) and the voltage drop was measured between two inner electrodes with a HP 34401 A multimeter (Agilent Technologies, Santa Clara, USA). Considering that the distance between adjacent electrodes (s) was 2.5 mm and the thickness (t) of the films was close to 200 nm, the necessary condition for employing four-point probe method for conductivity measurements (t <