Powder
X-ray diffraction (PXRD) patterns were investigated using a Rigaku
Ultima IV diffractometer with a monochromatic Cu Kα X-ray radiation
source (λ = 1.5 Å) in a scan range of 2θ = 10–80°
and with a 5° min–1 scan rate. The applied
voltage and current were well maintained at 40 kV and 40 mA, respectively.
The structures and surface morphologies were neatly studied by conducting
TEM analysis on a Philips Tecnai G2 instrument (200 kV) and FESEM
analysis on Zeiss Supra 55, respectively. The surface chemical composition
was investigated by X-ray photoelectron spectroscopy (XPS) in an ESCA+
spectrometer (monochromatized Al Kα, 1486.7 eV) adopting the
C1 peak at 284.9 eV for binding energy (BE) correction. UV–visible
diffuse reflectance spectroscopy (UV–vis DRS) was performed
by a JASCO 750 UV/visible spectrophotometer with a BaSO4 pallet as the reference. A JASCO spectrofluorometer FP8300 was used
to record the powder PL spectrum at an excitation wavelength of 325
nm. A JASCO FT/IR-4600 spectrometer was used to record the Fourier
transform infrared (FTIR) spectrum using the potassium bromide (KBr)
matrix. All measurements were performed at room temperature unless
particularly specified.
X-ray diffraction (PXRD) patterns were investigated using a Rigaku
Ultima IV diffractometer with a monochromatic Cu Kα X-ray radiation
source (λ = 1.5 Å) in a scan range of 2θ = 10–80°
and with a 5° min–1 scan rate. The applied
voltage and current were well maintained at 40 kV and 40 mA, respectively.
The structures and surface morphologies were neatly studied by conducting
TEM analysis on a Philips Tecnai G2 instrument (200 kV) and FESEM
analysis on Zeiss Supra 55, respectively. The surface chemical composition
was investigated by X-ray photoelectron spectroscopy (XPS) in an ESCA+
spectrometer (monochromatized Al Kα, 1486.7 eV) adopting the
C1 peak at 284.9 eV for binding energy (BE) correction. UV–visible
diffuse reflectance spectroscopy (UV–vis DRS) was performed
by a JASCO 750 UV/visible spectrophotometer with a BaSO4 pallet as the reference. A JASCO spectrofluorometer FP8300 was used
to record the powder PL spectrum at an excitation wavelength of 325
nm. A JASCO FT/IR-4600 spectrometer was used to record the Fourier
transform infrared (FTIR) spectrum using the potassium bromide (KBr)
matrix. All measurements were performed at room temperature unless
particularly specified.