The catalysts were characterized by X-ray diffraction (XRD, Bruke/D8-Advance, Cu Kα radiation, λ = 0.154056 nm) at a scanning rate of 4°/min ranging from 15° to 70°. The morphology was observed with a Hitachi S-4800 field emission scanning electron microscope (SEM) with an accelerating voltage of 3.0 kV. The surface composition of the catalysts was investigated using a Thermo Scientific energy dispersion X-ray (EDX) fluorescence analyzer (with a Mg Kα ADES (hν = 1253.6 eV) source) as an addition to the SEM and XPS (PHA-5400, SPECS, America). Light absorbance was measured with a Shimadzu UV-2550 spectrometer using BaSO4 as a reference in the wavelength region of 190–600 nm.
S 4800 field emission scanning electron microscope
Manufactured by Thermo Fisher Scientific
Sourced in Japan
The S-4800 field emission scanning electron microscope is a high-performance imaging and analytical tool. It uses a field emission electron source to produce a focused electron beam that scans the surface of a sample, generating signals that are collected and processed to create detailed images and data. The S-4800 provides high-resolution imaging capabilities for a wide range of materials and applications.
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Lab products found in correlation
Uv 2550 spectrometer, by Shimadzu (1 mentions)
Cocl2 6h2o, by Merck Group (1 mentions)
Nafion solution, by Merck Group (1 mentions)
Ethanol, by Merck Group (1 mentions)
Nicl2 6h2o, by Merck Group (1 mentions)
Tecnai g2 f20 electron microscope, by Thermo Fisher Scientific (1 mentions)
Escalab 250 xi xps system, by Thermo Fisher Scientific (1 mentions)
Bx51 fluorescence microscope, by Olympus (1 mentions)
Tecnai g2 20 transmission electron microscope, by Thermo Fisher Scientific (1 mentions)
D8 advance x ray diffractometer, by Bruker (1 mentions)
Tecnai g2 f20, by Thermo Fisher Scientific (1 mentions)
K alpha, by Thermo Fisher Scientific (1 mentions)
Tecnai g2 f20 transmission electron microscope, by Thermo Fisher Scientific (1 mentions)
5 protocols using s 4800 field emission scanning electron microscope
1
Comprehensive Catalyst Characterization
2
Synthesis and Characterization of Metal-Organic Catalysts
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5,10,15,20-Tetrakis(4-hydroxyphenyl) porphyrin, CoCl2·6H2O, NiCl2·6H2O, ethanol, KOH, carbon supported Ir (20 wt% Ir) (Ir/C), carbon supported Pt (20 wt% Pt) (Pt/C) and Nafion solution (5 wt%) were all purchased from the Sigma Company. All the chemicals were analytical grade (A.R.) in purity and used as received. Ultrapure water was obtained from a nanopure water system (18.2 MΩ cm, Thermo Scientific Barnstead) and used during the entire experiment.
Transmission electron microscopy (TEM) imaging and energy dispersive X-ray spectroscopy (EDX) were carried out on a FEI Tecnai G2 F20 electron microscope operated at 200 kV with the software package for automated electron tomography. Scanning electron microscopy (SEM) images were recorded with Hitachi S4800 field emission scanning electron microscope at 10 kV. X-ray photon spectroscopy (XPS) results were achieved by using a Thermo Scientific ESCALAB 250 Xi XPS system with the analysis chamber being 1.5 × 10–9 mbar and the size of X-ray spot being 500 μm.
Transmission electron microscopy (TEM) imaging and energy dispersive X-ray spectroscopy (EDX) were carried out on a FEI Tecnai G2 F20 electron microscope operated at 200 kV with the software package for automated electron tomography. Scanning electron microscopy (SEM) images were recorded with Hitachi S4800 field emission scanning electron microscope at 10 kV. X-ray photon spectroscopy (XPS) results were achieved by using a Thermo Scientific ESCALAB 250 Xi XPS system with the analysis chamber being 1.5 × 10–9 mbar and the size of X-ray spot being 500 μm.
3
Characterization of Quantum Dot-Polymer Structures
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UV-Vis absorption and PL emission spectra were measured in the range of 400–700 nm using a A590 UV-vis spectrometer (AOE, Shanghai, China) and PL Aurora 4000 fluorescence spectrophotometer (Qingxuan, Changchun, China), respectively. The morphological features and size of the suspended lines were revealed using a Hitachi S-4800 field emission scanning electron microscope (FE-SEM, Tokyo, Japan) at 2 kV and 3 kV. The microstructures of the QDs before and after DLW polymerization were analyzed using an FEI Tecnai G2 20 transmission electron microscope (Hillsboro, OR, USA) with an accelerating voltage of 200 kV. The PL emission spectra of the DLW processed QD–polymer structure were collected using a LabRAM HR800 laser microscope confocal Raman spectrometer (HORIBA Jobin Yvon, Paris, France). Fluorescence images were obtained using an OLYMPUS-BX51 fluorescence microscope. The transmission spectra of the DLW processed long pass absorptive filters were determined using a microscopic infrared spectrometer.
4
Comprehensive Characterization of Electrode Materials
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X-ray diffraction patterns were acquired using a Bruker D8-Advance X-ray diffractometer, employing Cu Kα radiation with a wavelength of 1.5405 Å and a scanning rate of 0.02° s−1. Monocrystalline silicon sample holders were utilized for sample application, ensuring minimal background diffraction interference. Sample morphologies were scrutinized using a Hitachi S-4800 field emission scanning electron microscope (SEM) and a transmission electron microscope (TEM, FEI Tecnai G2 F20). UV-vis transmittance spectra were captured using a Shanghai Aucy Scientific Instrument UV1902PC UV-vis-NIR spectrophotometer. X-ray photoelectron spectroscopy (XPS) measurements were conducted on a Thermo Fisher-VG Scientific (ESCALAB 250Xi) photoelectron spectrometer. Binding energies were calibrated using adventitious hydrocarbon referencing, with C 1s fixed at 284.60 eV. During the course of UOR, in situ Raman spectra (Alpha300R, WETEC, Germany) were employed to monitor the evolution of electrode surface species.
5
Comprehensive Material Characterization Protocol
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The phases and chemical composition of the as-synthesized samples were characterized by X-ray powder diffraction (XRD) on a Bruker D8 advance diffractometer. The surface species and chemical states of CN and Co-TCN were determined by X-ray photoelectron spectroscopy (XPS) measurements (Thermo Scientific K-Alpha) with a monochromatic Al Kα X-ray source (1486.6 eV) and a spot size (400 μm). The XPS data were acquired at room temperature and a lab-based ambient pressure. The XPS spectra were fitted according to the Doniach-Šunjić function. The required parameters are the binding energy, intensity, Lorentzian line width, Gaussian line width, and asymmetry factor.46,52 (link) The BET was analyzed by N2 adsorption–desorption using an Autosorb-iQ. A Hitachi S4800 field emission scanning electron microscope (SEM) and FEI Tecnai G2 F20 transmission electron microscope (TEM) were used to analyze the microstructure. The sheet resistance was measured by using a four-point probe (CRESBOX).
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