The morphological characteristics of the microcapsules containing the polyphenols were identified using scanning electron microscopy (SEM) with an JEOL JSM-6610LV microscope (JEOL Inc., USA) with an acceleration voltage of 10 kV. Before imaging, each sample was sputter-coated with gold into a JEOL JFC-1100 sputter for 3 min. All the samples were processed and visualized at room temperature (~20 °C). Digital images were captured using Quartz PCI imaging software v8 (Quartz Imaging Corp., Vancouver, BC, Canada).
Jsm 6610lv microscope
Manufactured by JEOL
Sourced in United States, Japan
The JSM-6610LV is a low-vacuum scanning electron microscope (SEM) manufactured by JEOL. It is designed to observe and analyze a wide range of samples, including those that are not electrically conductive or sensitive to electron beam exposure. The JSM-6610LV provides high-resolution imaging and versatile capabilities for various applications, such as materials science, life sciences, and nanotechnology research.
Automatically generated - may contain errors
Lab products found in correlation
Jfc 1100 sputter, by JEOL (2 mentions)
Em scd005 sputter coater, by Leica (2 mentions)
Uv 3600 plus uv vis nir spectrophotometer, by Shimadzu (1 mentions)
Vacprep 061 sample degas system, by Micromeritics (1 mentions)
Vacuum desk 5, by Denton (1 mentions)
Mini spray dryer b 290, by Büchi (1 mentions)
Sputter coater 108 auto, by Cressington (1 mentions)
Axio imager m1 microscope, by Zeiss (1 mentions)
10 protocols using jsm 6610lv microscope
1
Morphological Characterization of Polyphenol Microcapsules
2
Characterization of Greenly Synthesized TiO2 NPs
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The morphology and elemental composition of the greenly synthesized TiO2 NPs were studied by scanning electron micrographs and X-Ray energy dispersion spectra, respectively, obtained with a JSM-6610-LV microscope, JEOL. Structural analysis of samples was performed using X-ray diffraction patterns collected in a D8 Avance A25 Bruker X-Ray diffractometer equipped with CuKα radiation. Textural properties of titania samples were determined by the N2 thermal adsorption measurements using TriStar II-3020 equipment, Micromeritics. Before the analysis, the samples were dried under vacuum (10–3 torr) at 300 °C for 3 h using a VacPrep 061-Sample degas system, Micromeritics. Obtained isotherms were analyzed via the Brunauer-Emmet-Teller (BET) and Barrett-Joyner-Halenda (BJH) models for the surface area and porosity determination, respectively. The optical characterization of the powder samples was determined by UV–Vis spectroscopy in diffuse reflectance mode using an UV-3600 Plus UV–VIS-NIR spectrophotometer, Shimadzu, equipped with an integrating sphere. The samples were placed in a quartz cell with 2 mm in the light path for the measurement. The electronic state of prepared samples was studied by the XPS technique with a PHOIBOS spectrometer, SPECS, with 150 WAL hemispherical energy analyzer and a monochromatic source (AlKα Xray, 1486.6 eV).
3
Scanning Electron Microscopic Analysis of Jacobsen Catalysts
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Scanning electron microscopic (SEM) images of (R,R)-Jacobsen/Cell(NEt2) and (S,S)-Jacobsen/Cell(NEt2) materials were obtained using a JEOL JSM 6610LV microscope located at Laboratório Multiusuário de Microscopia Eletrônica (LAMUME-IF/UFBA, Brazil). To this end, samples were coated with a gold film by controlled deposition, using a Sputter Coater Denton Vacuum Desk V apparatus. Analyses were conducted with an electron beam of 10 keV. The images were processed with a resolution of 2 × 103 magnitudes.
4
SEM Imaging of Substrata Samples
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
For SEM, fragments of analyzed substrata were sampled via adhesive carbon tape on aluminum cylinders. Images were obtained at the University of Belgrade—Faculty of Mining and Geology using a JEOL JSM–6610LV microscope. Samples were gold coated (d = 15 nm, ρ = 19.2 g/cm3) with a Leica EM SCD005 sputter coater. Secondary electron and backscattered electron images were obtained using a W-filament gun, at 20 kV acceleration voltage in high-vacuum mode (15–30 μPa of pressure in the sample chamber) and magnifications ranging from 150 to 30,000×.
5
Spray-dried A. indica Microcapsules Analysis
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The optimal treatment was submitted to scanning electron microscopy (SEM) analysis. Previously, the treatment was dehydrated and pulverized using a Spray-dryer (Buchi, Mini spray-dryer B-290, Switzerland). The equipment was adjusted to the following conditions: feed flow at 6 mL/min, the inlet temperature of 160 °C, and drying airflow at 40 m3/h. The powder was recovered and stored in hermetically sealed bags at room temperature until SEM analysis.
The morphological characteristics of the microcapsules containing the A. indica extracts were identified by scanning electron microscopy (SEM) using a JEOL JSM-6610LV Microscope (JEOL Inc., Peabody, MA, USA) with an acceleration voltage of 10 kV. Before imaging, each sample was sputter-coated with gold into a JEOL JFC-1100 sputter for 3 min. All the samples were processed and visualized at room temperature (20 °C). Digital images were captured using Quartz PCI imaging software v8 (Quartz Imaging Corp., Vancouver, British Columbia, Canada).
The morphological characteristics of the microcapsules containing the A. indica extracts were identified by scanning electron microscopy (SEM) using a JEOL JSM-6610LV Microscope (JEOL Inc., Peabody, MA, USA) with an acceleration voltage of 10 kV. Before imaging, each sample was sputter-coated with gold into a JEOL JFC-1100 sputter for 3 min. All the samples were processed and visualized at room temperature (20 °C). Digital images were captured using Quartz PCI imaging software v8 (Quartz Imaging Corp., Vancouver, British Columbia, Canada).
6
Characterizing Heavy Metal-Saturated Zeolite
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The surface structure and elemental composition of the natural zeolite saturated with lead, cadmium, and zinc was observed by scanning electron microscopy (SEM) and energy dispersive X-ray (EDS) analysis on a JEOL JSM-6610LV microscope (JEOL Ltd., Tokyo, Japan) in Belgrade (Serbia). A few grains of saturated zeolite were taken from the top of the zeolite layer in the column each time before the regeneration cycle. Since the samples are non-conductive, they were coated with a thin layer of gold and subjected to SEM observations at magnifications from 100 to 5000. SEM revealed information about the surface morphology, while EDS provided a spot analysis of the elemental composition at different features that were observed in the SEM micrographs.
7
Scanning Electron Microscopy Sample Preparation
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Samples cut into cube shapes (3 mm3) were fixed with 2.5% (v/v) glutaraldehyde solution at 4 °C overnight. The samples were immersed in a 4% (v/v) osmium tetroxide solution for 5 h. Dehydration was done in low (10%, v/v) to high (100%, v/v) concentrations of ethanol after three washes with dilute water. Dried samples were coated with gold using a coater (model #108 Auto Sputter Coater, Cressington Scientific Instruments Ltd., Waterford, UK). A scanning electron microscope (SEM, model #JSM-6610LV microscope, JEOL Ltd., Tokyo, Japan) was used to analyze the microstructure at 1000 times magnification.
8
Microscopic Analysis of Fungal Interactions
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Morpho-physiological changes in hyphae of three M. laxa isolates induced by benzene extract of the P4/16_1 isolate under co-culture growth conditions were observed using optical and scanning electron microscopy (SEM). For optical microscopy, samples were mounted in the standard mycological dye Lactophenol Cotton Blue and observed under a Zeiss AxioImager M1 microscope with AxioVision Release 4.6 software. Scanning electron microscopy was performed at the University of Belgrade, Faculty of Mining and Geology using a JEOL JSM-6610LV microscope with a W filament gun. Samples were gold-coated (d = 15 nm, ρ = 19.2 g/cm3) using a Leica EM SCD005 sputter coater. Secondary electron and back-scattered electron images were obtained at a 20 kV acceleration voltage in the high-vacuum mode (15–30 μPa in the sample chamber) with magnifications from 150× to 30,000×.
9
Di-rhamnolipids Impact on P. aeruginosa Adherence
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
To study the effect of di-rhamnolipids on P. aeruginosa PAO1 adherence to silicone surfaces and overnight bacterial culture was diluted to 5 × 107 cfu mL-1 in LB and 2 ml was added per well in six well microtiter plate. The silicone catheter pieces (Romed, Wilnis, Holland) of 1 cm were placed in each well containing diluted bacteria and incubated in the presence of di-rhamnolipids from Lysinibacillus sp. BV152.1 (F3) or DMSO. After 24 h, the culture medium was removed and the catheters were washed three times in PBS in order to remove the non-adherent strains. Biofilms were then fixed with cold methanol and the samples dried before the examination.
Catheters were glued to double-sided conductive carbon tab stuck on standard vacuum-clean stub, and were coated with gold (thickness of 15–20 nm) by the sputtering process (Leica EM SCD005 sputtering machine, Leica Microsystems, Mannheim, Germany). Sputtering was performed in the vacuum chamber under pressure <0.05 mbar using sputter current of 40 mA, the working distance of 50 mm and sputter time of 100 s. Such prepared samples were examined by JEOL JSM-6610LV microscope (JEOL United States, Inc., Peabody, MA, United States). An acceleration voltage of 20 kV was used.
Catheters were glued to double-sided conductive carbon tab stuck on standard vacuum-clean stub, and were coated with gold (thickness of 15–20 nm) by the sputtering process (Leica EM SCD005 sputtering machine, Leica Microsystems, Mannheim, Germany). Sputtering was performed in the vacuum chamber under pressure <0.05 mbar using sputter current of 40 mA, the working distance of 50 mm and sputter time of 100 s. Such prepared samples were examined by JEOL JSM-6610LV microscope (JEOL United States, Inc., Peabody, MA, United States). An acceleration voltage of 20 kV was used.
10
Meat Microstructure Visualization by SEM
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The structures and morphologies of the meat samples following different incubation times were observed under a JEOL JSM-6610LV microscope (JEOL Ltd., Tokyo, Japan) according to the method by Haga and Ohashi [15 (link)]. Pork loin samples were placed on scanning electron microscopy (SEM) stubs and sputter-coated with gold. Images were acquired at an accelerating voltage of 10 kV.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!