The microstructure of PVP-Alg-CHA composite was studied by scanning electron microscopy using the TescanVegaII microscope (Tescan, Brno, Czech Republic).
Vegaii microscope
Manufactured by TESCAN
Sourced in Czechia
The VegaII is a scanning electron microscope (SEM) produced by TESCAN. It is designed for high-resolution imaging and analysis of various samples. The VegaII features a state-of-the-art electron optical column and a range of detectors, allowing for detailed examination of the surface morphology and chemical composition of materials.
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Lab products found in correlation
2 protocols using vegaii microscope
1
Microstructure Analysis of PVP-Alg-CHA Composite
2
SEM and EDX Analysis of Samples
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SEM and EDX analyses were carried out using a VegaII microscope (Tescan, Czech Republic), with a Quantax elemental detector (Bruker, Billerica, MA, USA). The specimens were placed onto a microscope stub and a sputter coater (Cressington, UK) was used to cover specimens with a thin gold layer. Then, the specimens were introduced into the SEM chamber and analyses were performed using a high voltage of 20 kV.
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