Jem 100s
The JEM-100S is a transmission electron microscope (TEM) manufactured by JEOL. It is designed to provide high-resolution imaging of samples at the nanoscale level. The JEM-100S is capable of magnifying specimens up to 600,000 times, allowing for detailed observation and analysis of the internal structure and composition of materials.
Lab products found in correlation
32 protocols using jem 100s
Leaf Ultrastructure Microscopy Protocol
Imaging and Characterizing Protein Fibrils
Morphological Examination of Nanoparticles by TEM
Synthesis of LMWC-Coated Silver Nanoparticles
Ultrastructural Analysis of Synaptic Profiles
Characterization of Nanoparticle Properties
TEM Imaging of Sal-Doc Nanoparticles
Microscopic Evaluation of Nanocomposites
Ultrastructural Analysis of Secretory Granules
Transmission Electron Microscopy Specimen Preparation
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