Nsgo1 rectangular silicon cantilevers

A drop (10 µL) of sample—nanoemulsion diluted in ultra-pure water in 1:1000, v/v ratio—was deposited onto circular mica plate (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, CA, USA) and dried under vacuum in order to remove the excess of water. Detailed investigation of the morphology of the samples, as well as of the shape, distribution and size of the droplets was accomplished with NTEGRA prima atomic force microscope (NT-MDT). Due to the fragility of the thin layers of the AFM samples, intermittent-contact AFM mode was implemented. For this purpose, NT-MDT NSGO1 rectangular silicon cantilevers with Au reflective film were used. Nominal resonant frequency of these cantilevers is 150 kHz, while nominal force constant is 5.1 N/m. Image Analysis 2.2.0 (NT-MDT) software was implemented for processing of the obtained AFM data.

For the atomic force microscopy, NE sample (diluted in ultra-pure water in 1:1000, v/v ratio) was placed onto mica plate (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, CA, USA) and dried under vacuum to remove the excess water. NTEGRA prima atomic force microscope (NT-MDT) was used to inspect the morphology, shape, size, and distribution of the NE droplets. The intermittent-contact AFM mode was used, due to the samples’ fragility. NT-MDT NSGO1 rectangular silicon cantilevers with Au-reflective film were used for this purpose. Nominal resonant frequency of these cantilevers is 150 kHz, while nominal force constant is 5.1 N/m. Image Analysis 2.2.0 (NT-MDT) software was used to process the obtained data.