T 3400 sem
The T-3400 SEM is a scanning electron microscope manufactured by Hitachi. It is designed for high-resolution imaging and analysis of a wide range of samples. The T-3400 SEM utilizes an electron beam to scan the surface of a sample, producing images that provide detailed information about the sample's topography and composition.
Lab products found in correlation
2 protocols using t 3400 sem
Ethanol-Dehydration SEM Preparation
Scanning Electron Microscopy of Dehydrated Insects
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