Carbon film

The absorption spectra of the solutions containing 0.01 g of Ag₂S and Li-doped Ag₂S NPs (in 10 mL of chloroform) were measured using a SolidSpec-3700 UV–Vis–NIR spectrophotometer from Shimadzu. The photoluminescence (PL) spectra were measured by a Fluorolog-3 in TCSPC mode (HORIBA Scientific). All samples were excited by a CW 450 W xenon source, and directed to a single-grating spectrometer. The PL spectra were obtained using an InP/InGaAs detector equipped with an LN cooler. All TEM images were acquired on a JOEL JEM-2100F transmission electron microscope operating at 200 kV. The TEM samples were prepared by drop casting very thin nanoparticle solutions onto a 200 mesh copper grid with a carbon film (Ted Pella). Then X-ray diffraction spectroscopy (XRD) was conducted using a Rigaku D/MAX-220 V X-ray diffractometer coupled with a Cu K-alpha (1.540598 Å) source. The FT-IR was measured by EQUINOX 55 (Bruker). The Zeta potential and DLS were measured by ELS-77 (Otsukael).

All of the dispersions of PPy@CNFs were diluted
to 0.01 wt % for the DLS and TEM analysis. The DLS measurement was
conducted by utilizing a helium–neon laser with a wavelength
of 632.8 nm and a scattering angle of 173°. The refractive index
(RI) and viscosity of the Milli-Q dispersant were specified to be
at 1.324 and 0.887 × 10^–3 Pa s^–1, correspondingly. The samples were characterized by RI and absorption
values of 1.595 and 0.200, respectively. For TEM, about 5 μL
of the sample was sedimented on a copper grid coated with carbon film
(200 mesh, Ted Pella Inc. USA) and then incubated at room temperature
for 3 min, and the excess liquid was drained with filter paper. The
processed samples were loaded onto a JEM-1400 PLUS TEM microscope
(JEOL Ltd., Japan) and evaluated in bright field mode with an accelerating
voltage of 80 kV. Only the LCNF sample was stained.

The absorption spectra of solutions containing 0.01 g of Ag₂S and Li-doped Ag₂S NPs (in 10 mL of chloroform) were measured using a SolidSpec-3700 UV-Vis-NIR spectrophotometer from Shimadzu. The photoluminescence (PL) spectra were measured by a Fluorolog3 with TCSPC mode (HORIBA Scientific). All samples were excited by a CW 450 W xenon source, and directed to a single-grating spectrometer. The PL spectra were obtained using a InP/InGaAs detector equipped with an LN cooler. All TEM images were acquired on a JOEL JEM-2100F transmission electron microscope operating at 200 KV. The TEM samples were prepared by drop-casting very thin nanoparticle solutions onto a 200 mesh copper grid with a carbon film (Ted Pella). X-ray diffraction spectroscopy (XRD) for the NPs was performed using a Rigaku D/MAX-220 V X-ray diffractometer equipped with Cu K-alpha (1.540598 Å) source.