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Eds spectrometer

Manufactured by Oxford Instruments

The EDS spectrometer is an analytical tool used for elemental analysis of solid samples. It detects and measures the characteristic X-rays emitted by atoms when they are excited by an electron beam, allowing for the identification and quantification of the elements present in the sample.

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3 protocols using eds spectrometer

1

Comprehensive Characterization of Catalytic Materials

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The phase composition was investigated by X-ray diffractometry (XRD, Bruker D8 Advance). The surface morphologies and microstructures of the fabricated catalysts were characterized by field emission scanning electron microscopy (FESEM, JEOL, JSM-7000F) and high-resolution transmission electron microscopy (HRTEM, JEOL, JEM-2100). EDS analysis and mapping were performed by scanning transmission electron microscopy (STEM, FEI-200) equipped with an Oxford Instrument's EDS spectrometer. The element composition and valence state were measured using an X-ray photoelectron spectrophotometer (XPS, ESCALAB Xi+). Nitrogen sorption isotherms and specific surface area were measured on a Micromeritics ASAP 2020 instrument at 77 K, and the pore size distributions were obtained from the desorption branch of the isotherm using the Barrett–Joyner–Halenda algorithm. Raman spectra were collected using an HR 800 fully automatic laser Raman spectrometer with a laser wavelength of 633 nm. Hydrogen temperature-programmed reduction (H2-TPR) measurements were performed on an Auto ChemTM II 2920 chemisorption analyzer.
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2

Multi-Technique Characterization of Material Composition

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X-ray diffraction patterns were collected on Bruker D8 Advance to analysis phase composition. Field emission scanning electron microscopy (FESEM, JEOL, JSM-7000F) and high-resolution transmission electron microscopy (HRTEM, JEOL, JEM-2100) were employed to characterize surface morphologies and microstructures. A scanning transmission electron microscope (STEM, FEI-200) equipped with an Oxford Instruments EDS spectrometer was utilized to conduct EDS analysis and mapping. X-ray photoelectron spectroscopy (XPS) was performed on ESCALAB Xi+ to confirm element composition and valence state. Nitrogen sorption was tested on Micromeritics ASAP 2020 at 77 K, and the Barrett–Joyner–Halenda algorithm was adopted to evaluate pore size and pore volume. Raman spectra were collected on an HR 800 fully automatic laser Raman spectrometer.
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3

Comprehensive Material Characterization of Catalysts

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The phase composition was
explored by X-ray diffractometry (XRD, Bruker D8 Advance). Surface
morphologies were tested by field emission scanning electron microscopy
(FESEM, JEOL, JSM-7000F) and high-resolution transmission electron
microscopy (HRTEM, JEOL, JEM-2100). The scanning transmission electron
microscopy (STEM, FEI-200) equipped with an Oxford Instruments EDS
spectrometer was utilized to conduct EDS analysis and mapping. X-ray
photoelectron spectroscopy (XPS) was tested on ESCALAB Xi+ to confirm
the element composition and valence state. Nitrogen sorption was tested
on a Micromeritics ASAP 2020 at 77 K, and the Barrett–Joyner–Halenda
algorithm was adopted to evaluate pore size and pore volume. Raman
spectra were collected through an HR 800 fully automatic laser Raman
spectrometer. Inductively coupled plasma (ICP) measurement was performed
on Prodigy7. The emission lines of Ce 413.765 nm, Pd 342.124 nm, and
Au 242.795 nm were acquired for the analysis of the catalysts.
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