Eds spectrometer
The EDS spectrometer is an analytical tool used for elemental analysis of solid samples. It detects and measures the characteristic X-rays emitted by atoms when they are excited by an electron beam, allowing for the identification and quantification of the elements present in the sample.
Lab products found in correlation
3 protocols using eds spectrometer
Comprehensive Characterization of Catalytic Materials
Multi-Technique Characterization of Material Composition
Comprehensive Material Characterization of Catalysts
explored by X-ray diffractometry (XRD, Bruker D8 Advance). Surface
morphologies were tested by field emission scanning electron microscopy
(FESEM, JEOL, JSM-7000F) and high-resolution transmission electron
microscopy (HRTEM, JEOL, JEM-2100). The scanning transmission electron
microscopy (STEM, FEI-200) equipped with an Oxford Instruments EDS
spectrometer was utilized to conduct EDS analysis and mapping. X-ray
photoelectron spectroscopy (XPS) was tested on ESCALAB Xi+ to confirm
the element composition and valence state. Nitrogen sorption was tested
on a Micromeritics ASAP 2020 at 77 K, and the Barrett–Joyner–Halenda
algorithm was adopted to evaluate pore size and pore volume. Raman
spectra were collected through an HR 800 fully automatic laser Raman
spectrometer. Inductively coupled plasma (ICP) measurement was performed
on Prodigy7. The emission lines of Ce 413.765 nm, Pd 342.124 nm, and
Au 242.795 nm were acquired for the analysis of the catalysts.
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