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X pert pro mpd

Manufactured by Horiba
Sourced in Germany

The X'Pert Pro MPD is a versatile X-ray diffractometer designed for materials analysis. It is capable of performing various X-ray diffraction techniques, including powder diffraction, thin-film analysis, and in-situ studies. The system features a high-performance goniometer, advanced optics, and a sophisticated software suite for data acquisition and analysis.

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2 protocols using x pert pro mpd

1

Comprehensive Characterization of Novel Nanomaterial

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All utilized solvents and materials that were commercially available, has been purchased from Merck and Fluka and used as soon as opening. FT-IR (Fourier transform infrared spectroscopy), UV–Vis (Ultraviolet visible spectroscopy), EDS, Map and FESEM (Energy dispersive spectroscopy) (Field emission scanning electron microscopy), AFM (Atomic force microscopy), 2D Fluorescence Microscopy, 1H-NMR (Nuclear magnetic resonance), PXRD (Powder XRay diffraction), DLS and Zeta potential (Dynamic light scattering), AST and ALT liver index, and TEM (Transmission electron microscopy) analysis have been performed by flowing devices respectively: Unicam Maston 1000 FT-IR spectrophotometer (room temperature, 400–4000 cm−1, KBr pellets), Carrying 100 Bio Varian spectrophotometer (quartz cells,10 mm path length), MIRA3 TESCAN, ARA-AFM, FACSCalibur (BD, Germany), Bruker FT-NMR 500 MHZ spectrometer (1H-NMR of L and PdL, DMSO-d6 and CDCl3), PANalytical company X’Pert Pro MPD, HORIBA SZ-100, Selectra pro autoanalyzer spectrophotometer, and ZEISS em900.
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2

Synthesis and Characterization of Cu Foam@Co3O4 NWs and Cu@Co3O4@Ag SERS Substrate

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The synthesized Cu foam@Co3O4 NWs and Cu@Co3O4@Ag SERS substrate were characterized by SEM (JEOL, Japan, 15 kV), XRD (X’ Pert PRO MPD, The Netherlands, 5°/min, 10°–90°), Raman spectra were recorded from a Horiba JY iHR550 (France) system with excitation wavelength at 532 nm (~1.5 mW). During measurements, the laser beam was focused on a spot of 2 μm diameter by a microscope objective with a magnification of 50×. The contact angle is measured by the SINDIN contact angle measuring instrument (SDC-100, Qingdao, China), TEM and HRTEM images were acquired using a JEM-2100 electron microscopy (JEOL), with an Operating Voltage at 200 kV.
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