Ultra scan 400sp
The Ultra Scan 400SP is a laboratory-grade scanning electron microscope designed for detailed surface analysis. It features a high-resolution imaging capability, enabling users to examine samples at the micro- and nanoscale levels. The instrument is equipped with advanced analytical tools to provide comprehensive data on the composition and structure of various materials.
Lab products found in correlation
4 protocols using ultra scan 400sp
Synthesis and Characterization of Siloxene/PVDF Piezofibers
Comprehensive Materials Characterization Methods
Example 1
Analytical Methods:
X-ray diffraction (XRD) analyses were performed on a Bruker D8 Advance diffractometer system with an operating voltage of 40 kV and a current of 40 mA by using Cu Kα radiation (λ=1.5405 Å) and a graphite monochromator. The samples were investigated over the 28 range 10-80° at a scanning speed of 2 min−1. Fourier transform infrared (FT-IR) spectra were collected on a Bruker FT-IR spectrometer by using the KBr pellet technique. Thermal gravimetric analysis (TGA) analyses were carried out using a thermogravimetric analyzer (Discovery, TA, USA). A 5.0 mg sample was placed in an aluminum pan and heated from 30 to 600° C. under N2 at a heating rate of 10° C./min. The morphologies and sizes of the resulting products were determined with field emission scanning electron microscopy (TESCAN LYRA3, Czech Republic). TEM images were recorded by using a transmission electron microscope (JEOL, JEM 2011) operated at 200 kV with a 4 k×4 k CCD camera (Ultra Scan 400SP, Gatan). PL measurements were performed with a spectrofluorometer (Fluorolog FL3-iHR, HORIBA Jobin Yvon, France). The chemical compositions of the samples were determined with X-ray photoelectron spectroscopy (XPS) by using an X-ray photoelectron spectrometer (ESCALAB-250, Thermo-VG Scientific) with Al—Kα radiation (1486.6 eV).
Comprehensive Analytical Characterization of Materials
Example 1
Analytical Methods:
X-ray diffraction (XRD) analyses were performed on a Bruker D8 Advance diffractometer system with an operating voltage of 40 kV and a current of 40 mA by using Cu Kα radiation (λ=1.5405 Å) and a graphite monochromator. The samples were investigated over the 20 range 10-80° at a scanning speed of 2 min−1. Fourier transform infrared (FT-IR) spectra were collected on a Bruker FT-IR spectrometer by using the KBr pellet technique. Thermal gravimetric analysis (TGA) analyses were carried out using a thermogravimetric analyzer (Discovery, TA, USA). A 5.0 mg sample was placed in an aluminum pan and heated from 30 to 600° C. under N2 at a heating rate of 10° C./min. The morphologies and sizes of the resulting products were determined with field emission scanning electron microscopy (TESCAN LYRA3, Czech Republic). TEM images were recorded by using a transmission electron microscope (JEOL, JEM 2011) operated at 200 kV with a 4 k×4 k CCD camera (Ultra Scan 400SP, Gatan). PL measurements were performed with a spectrofluorometer (Fluorolog FL3-iHR, HORIBA Jobin Yvon, France). The chemical compositions of the samples were determined with X-ray photoelectron spectroscopy (XPS) by using an X-ray photoelectron spectrometer (ESCALAB-250, Thermo-VG Scientific) with Al-Kα radiation (1486.6 eV).
Electrochemical Characterization of ITO Electrodes
EXAMPLE 3
Instrumentation
The pH values of the buffer solutions were recorded using a dual channel pH meter (XL60, Fisher Scientific). All electrochemical measurements were performed using a CHI (760E) electrochemical workstation (CH Instruments, Austin, Tex.). Bare ITO and modified ITO were used as the working electrodes, Ag/AgCl was used as the reference electrode, and a platinum wire was used as the counter electrode. All electrochemical experiments were carried out at RT without deaeration. Images were obtained by using a field emission scanning electron microscope (FE-SEM, TESCAN LYRA 3, Czech Republic), and by using a transmission electron microscope (TEM, JEOL, JEM 2011) operated at 200 kV and equipped with a 4 k×4 k CCD camera (Ultra Scan 400SP, Gatan).
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