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Fluoromax 3 spectrofluorometer

Manufactured by Hamamatsu Photonics

The FluoroMax®−3 Spectrofluorometer is a laboratory instrument designed for fluorescence spectroscopy. It measures the emission spectrum of a sample when it is excited by a light source.

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3 protocols using fluoromax 3 spectrofluorometer

1

Comprehensive Characterization of Magnetic Nanoparticles

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TEM and high-resolution TEM images were acquired on a Tecnai G2 F20 electron microscope (FEI, Hillsboro, OR) operating at a voltage of 200 kV. Powder X-ray diffraction (XRD) patterns were acquired from lyophilized samples using a D8 Bruker X-ray diffractometer with Cu Kα radiation. Raman spectra were acquired with a Raman-Microscope (Renishaw-InVia) using an Ar+ laser (514.5 nm) at room temperature. UV-Vis absorption spectra were obtained on a UV-Vis Spectrometer (Agilent Technologies, Santa Clara, CA). PL spectra were obtained on a JOBIN YVON Co. FluoroMax®−3 Spectrofluorometer equipped with a Hamamatsu R928P photomultiplier tube. X-ray photoelectron spectroscopy (XPS) experiments were carried out at the National ESCA and Surface Analysis Center. The magnetic properties of BFNPs were measured using a superconducting quantum interference device magnetometer (Quantum Design MPMS XL-7). The hydrodynamic size was determined using a Zetasizer Nano-ZS (Malvern Instruments, Worcestershire, UK) at room temperature. Fourier transform infrared (FT-IR) spectra were acquired using a Nicolet 5-DXB FTIR spectrometer with a resolution of 4 cm−1.
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2

Characterization of N-B-GQDs using Advanced Techniques

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TEM and high-resolution TEM imaging was performed using a Tecnai G2F20 electron microscope (FEI, Hillsboro, OR) operating at a voltage of 200 kV. Atomic force microscopy (AFM) images were obtained using a stand-alone AFM system (Bruker Dimension Icon-PT). Powder X-ray diffraction (XRD) patterns were acquired using a D8 Bruker X-ray diffractometer with Cu Kα radiation. UV-vis absorption spectra were obtained on a UV-vis Spectrometer (Agilent Technologies, Santa Clara, CA). Fourier transform infrared (FTIR) spectra were acquired using a Nicolet 5-DXB FTIR spectrometer with a resolution of 4 cm−1. The surface charge of N-B-GQDs was measured at room temperature using a Zetasizer Nano-ZS (Malvern Instruments, Worcestershire, UK). Raman spectra were acquired on a Raman-Microscope--Renishaw-InVia using an Ar+ laser (514.5 nm) at room temperature. PL spectra were obtained on a JOBIN YVON Co. FluoroMax®-3 Spectrofluorometer equipped with a Hamamatsu R928P photomultiplier tube. X-ray photoelectron spectroscopy (XPS) experiments were carried out at the National ESCA and Surface Analysis Center at the University of Washington.
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3

Comprehensive Nanomaterial Characterization Protocol

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TEM and high-resolution TEM images were acquired on a Tecnai G2 F20 electron microscope (FEI, Hillsboro, OR) operating at 200 kV. Powder X-ray diffraction (XRD) patterns were acquired from lyophilized samples using a D8 Bruker X-ray diffractometer with Cu Kα radiation. Raman spectra were acquired at room temperature with a Raman microscope (Renishaw-InVia) using an Ar+ laser (514.5 nm). UV-Vis absorption spectra were obtained on a UV-Vis spectrometer (Agilent Technologies, Santa Clara, CA). Photoluminescence spectra were obtained on a JOBIN YVON Co. FluoroMax®−3 Spectrofluorometer equipped with a Hamamatsu R928P photomultiplier tube. The hydrodynamic size and zeta potential were determined at 25°C using a Zetasizer Nano-ZS (Malvern Instruments, Worcestershire, UK). Fourier transform infrared (FT-IR) spectra were acquired using a Nicolet 5-DXB FTIR spectrometer with a resolution of 4 cm−1. The specific surface area, and micropore and mesopore volumes were determined by multipoint Brunauer–Emmett–Teller (BET) and Barret–Joyner–Halenda (BJH) desorption analyses, respectively.
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