Jsm 6510lv
The JSM-6510LV is a low-vacuum scanning electron microscope (SEM) designed for high-resolution imaging of a wide range of samples. It features a tungsten filament electron source and a LaB6 electron gun for stable, high-brightness illumination. The SEM can operate in low-vacuum mode, enabling the analysis of non-conductive and volatile specimens without the need for complex sample preparation.
Lab products found in correlation
262 protocols using jsm 6510lv
Surface Morphology Characterization by SEM
Characterization of TiO2 and CdS-TiO2 Nanostructures
Comprehensive Material Characterization Protocol
Elemental Composition Analysis of Nanometals
Mineralogical Analysis of Sulfide Minerals
Diatom Preparation and Microscopic Analysis
The cleaned material, sample and slide are deposited in the collection of MHA, Main Botanical Garden Russian Academy of Science, Moscow, Russia. The type slide was designated B209.
Morphological Analysis of Trophozoites
Antibacterial Efficacy of IONPs
Analyzing Resin-Dentin Interface Durability
Thermal and Spectroscopic Characterization of Catalysts
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