Asap 2420
The ASAP 2420 is a surface area and porosity analyzer designed to measure the specific surface area and pore size distribution of solid materials using the principles of gas adsorption. The instrument utilizes high-precision pressure and temperature sensors to accurately determine the volume of gas adsorbed on the sample surface at various relative pressures. This data is then used to calculate the specific surface area and pore size distribution of the material.
Lab products found in correlation
76 protocols using asap 2420
Comprehensive Characterization of Corn Straw
Surface Area and Pore Characterization
Comprehensive Characterization of Novel Materials
Comprehensive Material Characterization
Nitrogen Adsorption Analysis of Materials
the low-temperature nitrogen adsorption data (automatic sorption analyzer,
ASAP 2420, Micromeritics, USA). The samples were degassed at 77 K
before measurement.
Characterization of RF/TiO2 Nanocomposite
Comprehensive Characterization of Coal Fly Ash
Characterization of Alkyl Silane-Modified Mesoporous Silica Particles
provided by a water contact angle analysis (WCA) using a contact angle
analyzer from Git Soft Tech. Each WCA was conducted three times with
10 μL of distilled water, during which an image was taken using
a digital camera. The Brunauer–Emmett–Teller (BET) analyses
were performed using a Micromeritics ASAP 2420. Identification and
characterization of the alkyl silane-modified MSPs were carried out
by thermogravimetric analysis (TGA) and solid-state 29Si
magic angle spinning nuclear magnetic resonance (MAS NMR). TGA was
performed using a Q600 TA instrument at a rate of 10 °C min–1 in N2 gas at temperatures from 25 to 700
°C. Solid-state 29Si-MAS NMR measurements were performed
in a 9.4 T Bruker Ascend 400WB instrument using a 4 mm zirconia rotor
with a pulse length of 1.6 μs, a spinning rate of 11 kHz, and
a repetition delay of 20 s. The morphological and structural details
of the MSPs were studied using field-emission scanning electron microscopy
(FE-SEM) and transmission electron microscopy (TEM). The FE-SEM investigations
were carried out using a Tescan Mira-3 instrument with an accelerating
voltage of 2 kV. TEM was carried out on a JEOL JEM-2100 electron microscope
operated at 200 kV. Small-angle and wide-angle X-ray diffraction (XRD)
studies were performed using a SmartLab and a Miniflex 600 (Rigaku)
with scan ranges of 1.5–5 and 10–90°, respectively.
Nanocomposite Characterization Techniques
Comprehensive Characterization of Synthesized Samples
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