Scanning electron microscopy, SEM, was carried out at room temperature in a XL30 ESEM Philips instrument for analyzing the fracture surface found in the films of different composites. The samples were coated with a layer of 80:20 Au/Pd alloy and deposited in a holder prior to observation.
Xl30 esem
Manufactured by Philips
Sourced in Netherlands, United States, Germany, United Kingdom, Belgium, Japan
The XL30 ESEM is an environmental scanning electron microscope (ESEM) developed by Philips. It is designed to analyze and image samples in their natural, hydrated state without the need for complex sample preparation. The XL30 ESEM utilizes a unique environmental chamber that allows for the examination of samples in a controlled gaseous atmosphere, enabling the observation of dynamic processes and wet samples.
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Lab products found in correlation
Desk 2, by Denton (4 mentions)
Glutaraldehyde, by Merck Group (4 mentions)
Cm100, by Philips (3 mentions)
Alto 2500, by Ametek (3 mentions)
Med 010 balzers, by Oerlikon Balzers (3 mentions)
Scd005, by Philips (3 mentions)
Cx31rtsf, by Olympus (2 mentions)
Dfc295 camera, by Leica (2 mentions)
Med 010, by Oerlikon Balzers (2 mentions)
Sputter coater 108 auto, by Cressington (2 mentions)
Sputter coater 108 auto, by Philips (2 mentions)
X pert pro x ray diffractometer, by Malvern Panalytical (2 mentions)
Spectrum 400, by PerkinElmer (2 mentions)
Ftir spectrometer, by PerkinElmer (2 mentions)
D max c 3, by Rigaku (2 mentions)
Cpd030, by Philips (2 mentions)
Sem fe mira 2 lmu, by TESCAN (2 mentions)
Scandium five software, by Olympus (2 mentions)
Bal tec scd 500, by Leica (2 mentions)
Dulbeco, by Harvard Bioscience (2 mentions)
221 protocols using xl30 esem
1
Fracture Surface Analysis of Composite Films
2
Elemental Composition and Structural Analysis of TaN/Cu Coating
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The elemental composition of the TaN/Cu coating was analyzed using an electron probe microanalyzer. For elemental composition analysis, the TaN/Cu coating was prepared on a silicon substrate. The coating temperature and N2 flow rate were 773 K and 10 sccm, respectively. The X-ray diffraction (XRD) pattern was obtained using INEL XRD—3000 diffractometer(INEL, Celje, Slovenia). The glancing angle incidence was 5°. The radiation source was Cu Kα with λ = 1.54 Å. Surface morphology was observed using an XL30 ESEM Philips scanning electron microscope (SEM). Surface topography was examined using an atomic force microscope (AFM, Nanoscope E, digital Instruments Inc., USA). The images were collected in contact mode. A tungsten tip was used. The lateral resolution was about 0.1 nm.
3
Structural Analysis of Mesoporous Silicas
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X-ray diffraction (XRD) patterns of mesoporous silicas were obtained on a Philips diffractometer model PW3040/00 X´Pert MPD/MRD at 45kV and 40mA, using Cu Kα radiation (λ= . 4 Å). Scanning electron micrographs and morphological analysis were carried out on a XL30 ESEM Philips with an energy dispersive spectrometry system. Conventional transmission electron microscopy was carried out on a TECNAI 20 Philips, operating at 200 kV. Proton-decoupled 29 Si and 13 C MAS NMR spectra were recorded on a Varian-Infinity Plus Spectrometer at 400 MHz. N 2 gas adsorption-desorption isotherms were obtained using a Micromeritics ASAP 2020 analyzer, and pore size distributions were calculated using the Barrett-Joyner-Halenda (BJH) model on the desorption branch. Elemental analysis (% C, % N, % H) was performed with a LECO CHNS-932 analyzer (Universidad Rey Juan Carlos, Spain).
The thermal stability of the modified mesoporous silicas was studied using a Setsys 18A (Setaram) thermogravimetric analyzer (from 25 to 800 ºC at 10 ºC/min).
The thermal stability of the modified mesoporous silicas was studied using a Setsys 18A (Setaram) thermogravimetric analyzer (from 25 to 800 ºC at 10 ºC/min).
4
Cryofracture ESEM Morphology Analysis
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The morphology of the samples was analyzed at room temperature in an PHILIPS XL30 ESEM environmental scanning electron microscope (Leuven, Belgium) operating at 25 kV, using a secondary electron (SE) detector. The samples were cryofractured using liquid nitrogen before analysis.
5
Particle Size Characterization of PSMP
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The NP-stained PSMP samples were measured with a Philips XL30 ESEM using an acceleration voltage of 25 kV. The samples were prepared by drop-casting directly onto aluminum holders from diluted, ethanolic dispersions. The mean particle sizes and the corresponding size distribution of all PSMP samples were determined using the software ImageJ (Version: 1.52e, https://imagej.nih.gov/ij/ ).
6
Morphological and Elemental Analysis of Se-Te Nanoparticles
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The morphology and elemental composition of the purified Se- and Te-NPs were analyzed through scanning electron microscopy (SEM). Nanoparticles were fixed, dehydrated with increasing ethanol concentrations and dried through the critical point method by using liquid CO2. They were mounted on metallic specimens stubs and then directly observed through XL30 ESEM (FEI-Philips) equipped with an EDAX micro-analytical system.
7
Lung sample imaging by SEM
8
Stomatal Analysis of ZmPIF1 Transgenic Rice
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Flag leaves of 40‐day‐old rice of ZmPIF1 transgenic lines and WT were detached. Leaves of 30‐day‐old Arabidopsis of ZmPIF1 transgenic lines and WT were detached and fixed in glutaraldehyde (2.5%), and images of the stomata were obtained by environmental scanning electron microscopy (XL‐30ESEM, PHILIPS, Netherland). Stomatal densities, lengths and apertures were measured randomly using Image‐Pro Plus6.0 software (Media Cybernetics, USA).
9
SEM Imaging of Dried Specimens
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We used scanning electron microscope photography (Philips XL 30 ESEM with detector SE) to obtain images (e.g. Figure 1) of dried specimens coated with a gold layer of 10 -12 m. The equipment was set to operate at 20KV acceleration voltage, at 35 for the magnification and at 28.9 mm for the working distance.
10
Scanning Electron Microscopy of Grapevine Wood Degradation
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Scanning electron microscopy (SEM) was performed on incubated grapevine wood blocks (for 30 and 90 days) to confirm that the degradation was carried out by the inoculated Fmed strains: the surface of the dried samples was ground and polished with the Leica EM TXP Target Surfacing System. After sputtering with 20 nm gold, the wood structure was analyzed using the Philips XL30 ESEM environmental scanning electron microscope with an SE detector at an accelerating voltage of 5-10 kV. The image processing was done with DISS5 Software from REM-X GmbH Bruchsal (Germany).
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