Nicolet nexus 670

All chemicals in analytical grade were purchased from chemical companies and were used without further purification. FT-IR and ¹H, ¹³C NMR spectra were recorded on Thermo Nicolet Nexus 670 and Bruker Avance 300 MHz spectrometers, respectively. Melting points were measured on Electrothermal 9100 apparatus and were uncorrected. Mass spectra of the samples were obtained from Mass spectrometer (Agilent, 5975C, 20–70 eV). Morphology and size distribution of nanoparticles were determined by scanning electron microscopy (SEM) using FESEM-TESCAN followed by energy-dispersive X-ray analysis (EDX). Magnetic property of materials were measured by vibrating sample magnetometer (VSM, model MDKFT) under magnetic fields up to 20 kOe. Elemental composition of the samples was determined using inductively coupled plasma-optical emission spectrometer (ICP-OES). Specific surface area and pore size distribution of nanoparticles were determined on Belsorp-Max (Japan) instrument using N₂ adsorption–desorption isotherm. X-ray diffraction (XRD) analysis was carried out by X'PertPro diffractometer. TLC was applied for monitoring of the reactions over silica gel 60 F254 aluminum sheet. All products were identified by physical and spectral data followed by comparison with authentic data.

All starting materials, reagents, and solvents were commercially available (purchased from Merck, Sigma-Aldrich, and Fluka companies) and used directly without further purification. SOLTEC SONICA 2400 MH S3 (300 W) instrument was used for ultrasonic irradiation. FT-IR spectra were recorded on Thermo Nicolet Nexus 670 spectrometer, and ¹H NMR spectra were obtained by Bruker Avance 300 MHz and 400 MHz spectrometer. The crystalline structures of the prepared nanocomposites were analyzed by powder X-ray diffraction (PXRD) on a Philips PANalytical X'PertPro diffractometer (Netherlands) in 40 kV and 30 mA with a monochromatized Cu Kα radiation (λ = 1.5418 Å). The SEM images, EDX diagram, and elemental mapping obtained from FESEM-TESCAN MIRA3 electronic microscope. The TEM images were obtained from Zeiss EM10C-100 kV transmission electron microscope. The elemental analysis was carried out by inductively coupled plasma-optical emission spectrometry (Optima 7300DV ICP-OES). The magnetic properties of the prepared samples were measured using a vibrating sample magnetometer (Meghnatis Daghigh, Iran) under magnetic fields up to 20 kOe.