Jem 2100f electron microscope

TEM and EDS were analyzed for microstructure and composition on the JEM-2100F electron microscope operated at 200 kV. STEM and element mapping scanning were obtained on field-emission Magellan 400 microscope under the FEI Company. XRD pattern was recorded on a Rigaku D/MAX-2200 PC XRD system. XPS spectrum was recorded on ESCAlab250 (Thermal Scientific). DLS and Zeta potential were tested on Zetasizer Nanoseries (Nano ZS90, Malvern Instrument Ltd.). AFM images were collected on the Veeco DI Nanoscope Multi Mode V system. UV-vis-NIR absorption spectra were recorded on UV-3101 Shimadzu UV-vis-NIR spectrometer. FTIR pattern was recorded for the analysis of chemical bonds. The quantitative analysis of Fe element was conducted on inductively coupled plasma-optical emission spectrometry (ICP-OES, Agilent 725, Agilent Technologies). Raman spectroscopy pattern was collected on a DXR Raman microscope (Thermal Scientific, USA). ESR spectrum was measured using DMPO as the nitrogen trapping agent by Bruker EMX1598 spectrometer.

TEM studies were carried out on a JEOL JEM-2100F electron microscope and a FEI Tecnai G20, both operating at 200 kV. For this analysis, approximately 2 mg of each sample was dispersed in 20 ml of high purity cyclohexane (Merck, 99.9%) via sonication (~15 s); then a drop of each suspension was deposited on carbon-coated grids (400 mesh) covered with thin amorphous carbon film (lacey carbon). To avoid contamination, specimens were inserted in the TEM immediately following preparation. Bright field images were collected at several magnifications in order to observe structure and size homogeneity. Calculated HRTEM images were obtained with the help of the MacTempasX software, Total Resolution LLC. The simulated electron diffraction pattern images were obtained with the SingleCrystal software (CrystalMaker Software Ltd.).