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D8 focus advance diffractometer

Manufactured by Bruker

The D8 FOCUS Advance is a compact, floor-standing X-ray diffractometer designed for fast, high-quality phase analysis and structural characterization of solid samples. The instrument features a Bragg-Brentano geometry and an advanced goniometer system for precise sample positioning and data collection.

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2 protocols using d8 focus advance diffractometer

1

Characterization of Pd Nanoparticles on rGO

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Powder X-ray diffraction (XRD) analyses were performed on a Bruker D8-FOCUS Advance diffractometer with Cu Kα radiation (λ = 1.540598 Å). The average crystal size of the Pd nanoparticles was subsequently calculated using the Scherrer equation (D = 0.9λ/β cos θ, where λ = 1.540598 Å is the wavelength of the X-ray, β is the full-width at half-maximum height and θ is the diffraction angle).48 (link) Surface morphology of the prepared catalyst was characterized by scanning electron microscopy (SEM) on a Hitachi-SU8010 microscope. Transmission electron microscopy (TEM) analysis on the catalysts was carried out on Tecnai G220 microscope. The surface composition of the IE-Pd/rGO catalyst was analyzed using a ULVAC-PHI Quantera II photoelectron spectroscopy (XPS) system with Al Kα radiation ( = 1486.6 eV). The thermogravimetric (TG) analysis was carried out on a STA449F3 thermogravimetric analyzer under an O2 atmosphere from 30 to 800 °C at a heating rate of 10 °C min−1. Pd loading of the catalysts was calculated from the residual weight ratio at 800 °C of the sample (xPd = wreMPd/MPdO, where wre is the residual weight ratio of the sample, MPd and MPdO are the molecular weight of Pd and PdO, respectively).
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2

Characterization of Heterogeneous Catalysts

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Powder X-ray diffraction (XRD) patterns of the catalysts were recorded using a Bruker D8 Focus Advance diffractometer equipped with Lynx Eye detector with a Ni-filtered Cu Kα radiation source (λ = 1.5406 Å) in 2θ range of 0.6 to 2 with a step size of 0.01 and step time of 2 s. Fourier transformed infrared spectra (FT-IR) were recorded using a Bruker TENSOR 27 FT-IR spectrometer with 4 cm−1 resolution and 100 scans in mid IR region (4000–600 cm−1) employing KBr pellet technique. Nitrogen adsorption–desorption isotherms were measured at 77 K using Micromeritics 3Flex surface area analyzer, in which catalysts were outgassed at 300 °C for 6 h prior to the sample measurements. Helium was used as the carrier gas. Specific surface area was calculated using BET (Brunauer–Emmett–Teller) equation and pore-size distribution was obtained from desorption branch of the isotherm using BJH (Barrett–Joyner–Halenda) method. Total number of acids sites and acid strengths of the samples were determined by temperature programmed desorption of ammonia (NH3-TPD) using an Altamira AMI-300 equipment. Samples were activated at 300 °C for 1 hour in helium flow. Later, they were cooled and maintained at 100 °C prior to their exposure to ammonia vapour followed by purging with helium for 30 min. The desorption of ammonia was carried out by heating the reactor up to 350 °C at a steady rate of 10 °C min−1.
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