Crystalline structures of the prepared materials were determined by X-ray diffraction analysis (XRD) using a Bruker-AXS system (Bruker Company, Karlsruhe, Germany) with Cu-Ka radiation. The different elements in the prepared materials were identified by Energy dispersive X-ray spectroscopy (EDX) through an electron probe micro analyser JED 2300 (JEOL Company, Tokyo, Japan). Thermal analyses of the prepared materials were measured by two devices: differential scanning calorimetry (DSC) TA series Q600 and thermogravimetric analyzer TA series Q500 (TA company, New Castle, PA, USA). Imaging the nano size and morphology of the prepared materials were measured by scanning electron microscopy (SEM) JEOL, JSM-6330F system (15 kV/12 mA) and transmission electron microscopy (TEM) JEM 2100F (JEOL Company, Tokyo, Japan) with an acceleration voltage of 200 kV.
Axs system
Manufactured by Bruker
Sourced in Germany
The Bruker-AXS system is a laboratory equipment designed for X-ray analysis. It provides accurate and reliable measurements of the structural and chemical properties of materials through the use of X-ray diffraction and spectroscopy techniques.
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4 protocols using axs system
1
Characterization of Nanomaterials by Advanced Techniques
2
Comprehensive Materials Characterization
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X-ray diffraction analysis (XRD) was carried out using a Bruker-AXS system (Karlsruhe, Germany) with Cu-Kα radiation (λ = 0.154 nm). Energy-dispersive X-ray spectroscopy was carried out using an electron probe micro analyser JED 2300. Fourier transform infrared spectroscopy was recorded on a PerkinElmer Spectrum 400. Thermal gravimetric analysis was carried out on a TA thermogravimetric analyser (series Q500). Differential scanning calorimetry (DSC) analysis was carried out using TA series Q 600, with a heating rate of 10 °C min−1. Scanning electron microscopy was performed on a JEOL, JSM-6330F system (15 kV/12 mA). Transmission electron microscopy (TEM) was carried out at room temperature on JEM 2100F with an acceleration voltage of 200 kV. Raman spectroscopy measurements were performed using a LabRAM HR Evolution system (Horiba-Jobin Yvon Technology), with a laser 633 ULF and the grating groove density was 300 grooves per mm.
3
Characterization of Nanolayered Structures
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Nanolayered structures and crystalline structures of the prepared samples were identified by a Bruker-AXS system (Bruker Company, Karlsruhe, Germany) with Cu-Kα radiation for X-ray diffraction analysis (XRD). An electron probe microanalyzer JED 2300 (JEOL Company, Tokyo, Japan) was used for detecting the elements in the prepared samples through energy dispersive X-ray spectroscopy (EDX). For studying the thermal behavior of the prepared samples, thermogravimetric analyzer TA series Q500 and differential scanning calorimeter (DSC) TA series Q600 (TA company, New Castle, PA, USA) were used under the flow of nitrogen. For imaging the nanosize and morphology of the prepared materials, a transmission electron microscope (TEM) JEM 2100F (JEOL Company, Tokyo, Japan) was used with different magnifications. The optical properties were measured for the prepared samples through the diffuse reflectance technique. A UV/VIS/NIR Shimadzu 3600 spectrophotometer (Shimadzu, Columbia, MD, USA) was used for measuring the absorbance of the liquid and solid samples.
4
Comprehensive Characterization of Nanomaterials
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Nanolayered structures and crystalline structures of the prepared samples were identified by a Bruker-AXS system (Bruker Company, Karlsruhe, Germany) with Cu-Ka radiation for X-ray diffraction analysis (XRD). An electron probe micro analyzer JED 2300 (JEOL Company, Tokyo, Japan) was used for detecting the elements in the prepared samples through energy dispersive X-ray spectroscopy (EDX). For studying the thermal behavior of the prepared samples, thermogravimetric analyzer TA series Q500 and differential scanning calorimetry (DSC) TA series Q600 (TA company, New Castle, PA, USA) were used under flow of nitrogen. FTIR spectroscopy was performed by using a Perkin–Elmer Spectrum 400 instrument as KBr discs in the range of 425–4000 cm−1. For imaging the nano size and morphology of the prepared materials, transmission electron microscopy (TEM) JEM 2100F (JEOL Company, Tokyo, Japan) has used with different magnifications. The optical properties were measured for the prepared samples through the diffuse reflectance technique. UV/VIS/NIR Shimadzu 3600 spectrophotometer (Shimadzu, Columbia, MD, USA) has used for measuring the absorbance of liquid and solid samples.
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