The chemical composition of the particles and their calcium-phosphate ratio was measured using a high sensitivity Kratos AXIS 165 spectrometer (Kratos Analytical Ltd, United Kingdom).
Kratos axis 165
Manufactured by Shimadzu
Sourced in United Kingdom
The Kratos AXIS 165 is an X-ray photoelectron spectroscopy (XPS) instrument designed for surface analysis. It is capable of providing detailed information about the chemical composition and electronic structure of a sample's surface.
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Lab products found in correlation
3 protocols using kratos axis 165
1
Elemental Composition Analysis of Particles
2
Characterization of Composite Hydrogels
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The hydrogels were
obtained at −50 °C, using a Beijing Boyikang Experimental
Instrument Co., Ltd. FD-1C-50 lyophilizer, completely removing water
after 5–7 days.46 (link)−54 (link) A field-emission scanning electron microscope (SEM) (S-4800II, Hitachi,
Japan) with 15 kV accelerating voltage and transmission electron microscope
(TEM, HT7700, Hitachi High-Technologies Corporation) were used to
analyze the nanomicroscopic surface of composite hydrogels. Elemental
composition and lattice structure of complexes were determined by
X-ray diffraction (XRD) with a copper Kα X-ray radiation source
and Bragg diffraction X-ray radiation source settings (Smart Lab,
Rigaku, Japan). The valence status and surface elements were analyzed
by X-ray photoelectron spectroscopy (XPS, Kratos AXIS 165, Kratos
Analytical, Kyoto, Japan). Thermogravimetry (TG) was tested by using
a NETZSCH STA 409 PC Luxxsi multaneous thermal analyzer (Netzsch Instruments
Manufacturing Co, Ltd., Germany) in argon gas. To research the pore
size distribution and specific surface area of hydrogels, Brunauer–Emmett–Teller
measurement (BET) (ASAP 2460) was adopted for analysis.
obtained at −50 °C, using a Beijing Boyikang Experimental
Instrument Co., Ltd. FD-1C-50 lyophilizer, completely removing water
after 5–7 days.46 (link)−54 (link) A field-emission scanning electron microscope (SEM) (S-4800II, Hitachi,
Japan) with 15 kV accelerating voltage and transmission electron microscope
(TEM, HT7700, Hitachi High-Technologies Corporation) were used to
analyze the nanomicroscopic surface of composite hydrogels. Elemental
composition and lattice structure of complexes were determined by
X-ray diffraction (XRD) with a copper Kα X-ray radiation source
and Bragg diffraction X-ray radiation source settings (Smart Lab,
Rigaku, Japan). The valence status and surface elements were analyzed
by X-ray photoelectron spectroscopy (XPS, Kratos AXIS 165, Kratos
Analytical, Kyoto, Japan). Thermogravimetry (TG) was tested by using
a NETZSCH STA 409 PC Luxxsi multaneous thermal analyzer (Netzsch Instruments
Manufacturing Co, Ltd., Germany) in argon gas. To research the pore
size distribution and specific surface area of hydrogels, Brunauer–Emmett–Teller
measurement (BET) (ASAP 2460) was adopted for analysis.
3
XPS Analysis of DMP1-coated Titanium
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A total of 4 disks (2 disks from each group) were subject to XPS analysis (Kratos AXIS-165, Kratos Analytical, Ltd., Manchester, UK). The chemical analysis of the DMP1 coated Ti surface and non-coated Ti surface was done using monochromatic XPS. The intensity of each element on the Ti disk surface was identified and graphically recorded in counts per second (cps).
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