Ols4000
The OLS4000 is a non-contact 3D measuring laser microscope designed for surface analysis and dimensional measurement. It utilizes a confocal scanning technique to provide high-resolution images and precise data on surface topography and roughness.
Lab products found in correlation
38 protocols using ols4000
Scanning Electron Microscopy Analysis of WLAP
Scanning Electron Microscopy Analysis of WLAP
Multimodal Characterization of Substrate Surfaces
The existence of elements in the substrate and morphology of substrates were analyzed by Energy-dispersive X-ray spectroscope (Hitachi S3400) and scanning electron microscope (SEM; JEOL JSM-6510LV). The surface roughness of the substrates was characterized by a 3D laser scanning microscope (LSM) (OLS 4000, Olympus Corporation, Tokyo, Japan). Wettability of the substrates was examined by evaluate of water contact angle (WCA) using a Dataphysics OCA 15 plus (Filderstadt, Germany). The surfaces of the substrate samples were characterized using sessile drop technique and Gaosuo software. The average of six CAs was obtained. H2O, C3H8O3, and CH3NO with specified factors (
Evaluation of Surface Roughness in Materials
Surface Topography and Roughness Analysis
Membrane Surface Characterization and Performance
Electrospun Fiber Profilometry Analysis
where M and N is a number of data points in X, Y direction, and Z is the surface height relative to the reference mean plate. The 2D images from profilometry analysis of all electrospun samples and thickness measurements are provided in the
Characterization of Worn Surfaces
Characterization of Diamond Film Properties
The device used for the T/R measurement is schematically shown in
Characterization of PEEK-based Composite Scaffolds
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