Jsm 7900f

A total of 2 μL of streptavidin-coated magnetic beads (10 mg/mL) was inserted in e-tubes to bind with 1 μL of biotin-conjugated AuNPs (2.66 mg/mL) for 1 h at room temperature (RT). For stabilizing the mixture on the magnet, removing steps were followed after 10 min. We used 1 $\times$ PBS for washing steps to remove any unbound AuNPs, and 10 min of stabilization on top of the magnet was necessarily performed to allow the magnetic beads to settle before removing solutions. Avidin (10 μg/mL, 15 μL) was added to the AuNP-MB-generating sites to bind biotin-conjugated biomolecules such as ALP and antibodies. Then, the mixture was placed for 1 h at RT. Then, the washing steps were repeated twice. For the characterization, the synthesized particles were transferred to a 96-well plate, and absorbance spectra were obtained using UV–Vis spectroscopy, FLUOstar Omega from BMG LABTECH (Ortenberg, Germany). The 96-well plates were from SPL life Sciences (Pocheon, Gyeonggi, Korea). All the experiments for the characterization of AuNPs were performed three times. For the field-emission scanning electron microscopy (FE-SEM) with energy-dispersive X-ray analysis (EDX), a JSM-7900F from JEOL Ltd. (Tokyo, Japan) was also used to examine the morphology of the AuNP-MBs (Figure 2 and Figure S1).

The sealers were filled into polytetrafluoroethylene molds (2 mm inner diameter, 5 mm height) and placed either in a 37 °C incubator or in an oven at 100 °C for 30 or 60 s, followed by being transferred to the incubator at 37 °C. Following storage for 48 h, the specimen’s surface was polished using SiC papers to #1200 and osmium-coated. The surface ultrastructure was examined using scanning electron microscopy (SEM; model JSM-7900F, JEOL, Tokyo, Japan), and elemental compositions were analyzed using energy-dispersive X-ray spectroscopy (EDS; model JED-2300, JEOL).

Structural characterizations of the Au, ZnO and AZO seed layers as well as ZnO NWs were performed using an X-ray Diffraction (XRD) with a CuK1 radiation on the high-resolution parallel beam diffractometer Brucker AXS D8 discover (Bruker, Karlsruhe, Germary). The morphological characterizations of the ZnO NWs surface and cross section were done by scanning electron microscopy (SEM) with a JEOL JSM-7900F (HRSEM, Croissy-sur-Seine, France). The extraction of the densities, lengths and diameters associated with the ZnO NWs was obtained using Image J software on SEM images [31 (link)]. The surface topography of the seed layers was measured with a Dimension ICON Brucker Atomic Force Microscope (AFM, Bruker France SAS, Palaiseau, France). The resistivity of each seed layer was analyzed with a semi-automatic hall effect measurement system HMS 5000 Microworld (Microworld, Grenoble, France).
The electrical performances were assessed using a test bench (Figure 4) designed by our team and described in detail by Oshman et al. [43 (link)]. The PENG was being solicited by the aluminum mechanical arm impacting its surface on 1 cm² area and was connected to a double buffer circuit consisting of a differential amplifier that measured the output voltage without applying any parasitic bias [20 (link)].

The structure of the 3D colloidal assembly was measured using a scanning electron microscope (JSM-7900F, JEOL Ltd., Tokyo, Japan). We manually marked the center of mass of the NPs composing the structure using ImageJ software and found their center coordinates using the function of Analyze Particles. To investigate the optical properties of 3D colloidal assemblies, we used an optical microscope (BX53M, Olympus, Tokyo, Japan) in dark-field mode using an objective lens (LMPlanFL N, 100×, NA = 0.8, Olympus). The spectral characteristics of the scattered light collected by the microscope were measured with a spectrometer mounted on the microscope (US/USB4000, Ocean Optics, Duiven, The Netherlands), and the color from the measured spectra was evaluated using CIE 1931 color space plugged in Origin 2021.

The specimens for microstructural observations with a field emission-scanning electron microscope/electron backscattered diffraction (FE-SEM/EBSD) were cut from the rolled sheets using the arc discharge cutting machine. The damaged layer of the surface was removed by emery paper up to #2000, and then electrolytic polishing in the nital solution (nitric acid and methanol mixture with 1:2 in volume) with a voltage of 6 V at 233 K for about 120 s. FE-SEM/EBSD observations were performed using JSM-7900F (JEOL) with the "symmetry" detector controlled by Aztec software (Oxford instruments). The EBSD measurements were performed with the acceleration voltage of 20 kV. The step size of EBSD was set to be 0.5  $\mu$ m for $r$ is lower than 40%, and $\le$ 50 nm for $r$ is higher than 40%.