Inspect s50

The structure and morphology of FMSP-nanoparticles was examined by scanning electron microscopy (SEM) (FEI, INSPECT S50, Brno, Czech Republic), and the size of fluorescent submicron magnetic nanoparticle was measured by transmission electron microscopy (TEM) (FEI, MORGAGNE.268, Brno, Czech Republic). The TEM and SEM analyses were done at the Department of Biophysics, Institute for Research and Medical Consultations, Imam Abdulrahman Bin Faisal University, Dammam, Saudi Arabia.

The surface morphologies of the AXGL5 and AXGL5D films were studied using a scanning electron microscope (SEM) (FEI, Inspect S50, Brno, Czech Republic). For this purpose, AX-GL film samples were fixed on the SEM metallic stub using double-sided adhesive tape. These samples were then coated with gold (Quorum, Q150R ES, Lewes, UK). The SEM was operated at an accelerating voltage of 20 KV, and micrographs were captured at different magnifications.

After bond testing, representative specimens derived from the separated glass-ceramic side of the assembly were dehydrated, sputter-coated with gold-palladium, and examined with a scanning electron microscope (SEM; Inspect S50, FEI Company, Hillsboro, OR, USA) operated at 15 kV.

The specimens were immersed in 1.0 M, 1.5 M and 2.0 M H₂SO₄ solution with and without inhibitor (2000 mg/L) for one week at ambient temperature. Then, the specimens were washed with demineralized water and dried at room temperature. The morphological structure of the 304 SS surface was observed using a scanning electron microscope (SEM; FEI Inspect S-50, Tokyo, Japan). Before observation, all specimens were sputtered with a 10 nm layer of gold.

Cross-sections and average thickness of the films were evaluated with a scanning electron microscope (In-spect™S50, FEI Company, Hillsboro, OR, USA) at room temperature since the internal structure of the composites was regarded as the most important for the multilayers assessment. Film samples were placed on adhesive tapes fixed to the surface of a special stand and gold sprayed. Different magnifications (1000×–5000×) were utilized.

Mature grains were harvested and naturally dried, then stored at room temperature. Grains of Nip and Olr were dehulled using a rice huller or manually. Then brown rice of Nip and Olr was ground into white rice (endosperms) using a rice polisher. The appearance quality of these white rice, including the percentage of endosperms with chalkiness and degree of endosperm chalkiness, was analyzed using a rice quality analyzer (TPMZ-A, Zhejiang Top Cloud-agri Technology Co., Ltd., Hangzhou, China).
Brown rice grains of Nip and Olr were transversely cut in the middle using a dissecting blade. Then the corresponding half-brown rice grains were mounted on stubs, and the transverse sections of these samples were first observed under a dissecting microscope (SMZ745T, Nikon, Tokyo, Japan). Then each of the same observed samples was mounted on a stub, and the transverse section was coated with gold and subsequently observed under an SEM (Inspect S50, FEI Company, Hillsboro, OR, USA) with an accelerating voltage of 20.00 kV. The transverse sections of the brown rice grains with or without chalkiness and the corresponding starch granules were observed and photographed under the SEM.