electron microscopy (SEM) was performed with an FEI Nova NanoSEM 450
system, equipped with an energy-dispersive X-ray (EDX) detector and
operating at acceleration voltages of 5–10 kV (
The Nova NanoSEM 450 is a high-resolution scanning electron microscope system designed for advanced imaging and analysis applications. It features a field emission electron source, high-performance electron optics, and a range of detection capabilities to enable detailed characterization of nanoscale structures and materials.
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