An energy-dispersive X-ray spectroscopy (EDX) detector (EMAX, EX-350, Horiba, Tokyo, Japan) on a scanning electron microscope (SEM) (S-4800 FEG, Hitachi, Tokyo, Japan) was used to assess elemental distribution development over time. Elemental distributions from the original implant sites to the newly formed bone sites at different time points were conducted on 200 μm paraffin-embedding sections acquired from undecalcified histology processing step. The sections were carbon-sputtered, and were linear or area scanned at an operating voltage of 20 kV. The distribution and constitution of Mg/Zn, Ca, P and Si on the surface of sections were subsequently identified. An average of three repetitions of each scanning were recorded and analyzed in software (INCA Energy software, Oxford Instruments, Abingdon, Oxfordshire, UK).
Inca energy software
Manufactured by Oxford Instruments
Sourced in United Kingdom, Germany, Japan
INCA Energy software is a X-ray microanalysis system designed to provide elemental analysis and imaging capabilities for scanning electron microscopes (SEMs). The software offers a suite of tools for data acquisition, processing, and visualization, enabling users to perform quantitative and qualitative analyses of materials at the micro- and nano-scale.
Automatically generated - may contain errors
Lab products found in correlation
Sem leo 1450vp, by Zeiss (2 mentions)
Jsm 5910 lv scanning electronmicroscope, by JEOL (2 mentions)
Ex 350, by Horiba (1 mentions)
S4800 feg, by Hitachi (1 mentions)
Evo ma15, by Zeiss (1 mentions)
Jsm 6500f sem, by JEOL (1 mentions)
Sili detector, by Oxford Instruments (1 mentions)
Technovit 7200 vlc, by Kulzer (1 mentions)
Quorum sputter coater q150t es, by Quorum Technologies (1 mentions)
Jsm 7001f, by JEOL (1 mentions)
X max silicon drift detector, by Oxford Instruments (1 mentions)
11 protocols using inca energy software
1
Elemental Mapping of Implant Surfaces
2
Analyzing Calcification in Atherosclerotic Plaques
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One cm in diameter and 1 cm in length of 5 plaques with macroscopic evidence of an eruptive calcification and 5 fibrocalcific plaques were fixed in in 4% (v/v) paraformaldehyde for 24h. The samples were treated as previously described [27 (link)]. Critical point drying (Agar Scientific, Essex, UK, Elektron Technology UK Ltd., Cambridge, UK) with supercritical CO2 was then performed to prevent cell deformation. EDX microanalysis was performed by using a liquid N2-cooled Si detector with a super-ultrathin Be window on unpost-fixed samples placed on specific copper stubs. Spectra were collected by a SEM LEO 1450VP (Carl Zeiss Meditec, Oberkochen, Germany) scanning electron microscope at acceleration voltage of 5 KeV employing an area scan mode (640 × 640 μm sampling area), 300 s acquisition time, and 32-37% detector dead time. Analysis of acquired spectra was performed under a nonstandard mode using atomic number-absorption-florescence correction (ZAF) methods using Inca Energy software (Oxford Instruments Ltd., High Wycombe, UK; Si(Li) detector, ATW - atmospheric thin window, resolution 133 eV for MnKα at 10 000 counts). For each specimen, we acquire 5 spectra on 8 mm2 of calcification surface in total.
3
Structural and Elemental Analysis of Coated Samples
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Scanning electron microscopy (SEM) is an electron optical imaging
technique that yields both topographic images and elemental information
when used in conjunction with energy-dispersive X-ray fluorescence
(EDXRF). Therefore, in this work, SEM (JSM 5910 LV Scanning Electron
Microscope, JEOL Ltd., Japan) attached with EDXRF (INCA Energy Software,
Oxford Instruments, U.K.) was used to observe the morphology and chemical
composition of the coated samples. Gold sputtering was used to make
the coating surfaces conductive for the SEM-EDXRF investigations.
To obtain additional structural information, FTIR in an attenuated
(ATR) mode was used to confirm the presence of the LVFX coating on
the PLC fiber.
technique that yields both topographic images and elemental information
when used in conjunction with energy-dispersive X-ray fluorescence
(EDXRF). Therefore, in this work, SEM (JSM 5910 LV Scanning Electron
Microscope, JEOL Ltd., Japan) attached with EDXRF (INCA Energy Software,
Oxford Instruments, U.K.) was used to observe the morphology and chemical
composition of the coated samples. Gold sputtering was used to make
the coating surfaces conductive for the SEM-EDXRF investigations.
To obtain additional structural information, FTIR in an attenuated
(ATR) mode was used to confirm the presence of the LVFX coating on
the PLC fiber.
4
Automated Inorganic GSR Analysis by SEM-EDX
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Inorganic GSR analysis was performed using a SEM-EDX, the EVO MA 15 from Zeiss (Germany) equipped with an 80 mm2 X-Max detector from Oxford Instruments (Germany). The research and detection of inorganic particles on the stubs was automated using the INCA Energy software also from Oxford Instruments (Germany). The search was performed with an accelerating voltage of 20 kV for the detection of heavy elements and a working distance of 8.5 mm. The particles were classified according to the ASTM guidelines, which is standard practice for the analysis of IGSR by SEM-EDX (3) (Table 4). The entire surface of the adhesive was analyzed for each protocol. After the analysis, no manual confirmation of the elemental composition and shape of particles classified as characteristic, consistent or commonly associated with GSR was performed. This step is important as part of a criminal investigation to confirm the classification but was considered to be less relevant (and very time consuming) in a research perspective. Thus, the presented results were obtained automatically and are indicative of the actual number of particles. For the Fifty-Fifty sampling, the particles detected in the "OGSR half" of the adhesive were manually removed (on the Excel sheet generated by the INCA Energy software).
5
Titanium Template Surface Characterization
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A JEOL JSM-6500F SEM (JEOL Japan, Inc., Japan) with a Si(Li) detector was used to perform energy-dispersive X-ray spectroscopy (EDS), which determined the surface composition of non-patterned medical grade IV titanium, EOS, and UV titanium templates. As the tested templates contained no biological material, no fixation or drying steps were required. Each template was fixed onto a copper stub and electrically grounded by carbon coating, before each surface was sputter-coated with an ultra-thin platinum film. Imaging was then performed in a high vacuum using a 10 kV electron beam and working distance of 15 mm. Single-point measurements and mapping analyses were performed using INCAEnergy software (Oxford Instruments, UK). Each surface characterization procedure was performed on six regions of two areas per surface type, and the average reading from two templates was calculated.
Surface wettability was measured by performing contact angle testing using a GBX Digidrop-DI goniometer and its accompanying Visiodrop software (GBX, Ireland). A deionized water droplet volume of 1.5 µl was used for every measurement. Point selection was repeated five times per position, of which three were selected for each template surface.
Surface wettability was measured by performing contact angle testing using a GBX Digidrop-DI goniometer and its accompanying Visiodrop software (GBX, Ireland). A deionized water droplet volume of 1.5 µl was used for every measurement. Point selection was repeated five times per position, of which three were selected for each template surface.
6
Elemental Analysis of Murine Enamel
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Fully mineralized lower hemi-jaws were dissected from perfused adult (approx. 3 months of age) K14-Bcl9/9l-flox, K14-Bcl9/9l-∆HD2 and K14-Pygo1/2-flox, and the respective Bcl9/9lflox, Bcl9/9l-∆HD2 and Pygo1/2-flox controls. Soft tissues were removed manually. The lower jaws were then dehydrated and embedded in Technovit 7200 VLC (Heraeus Kulzer, Wehrheim, Germany). Light-polymerized blocks were mounted on aluminium stubs, polished and coated with a 10-15 nm thick layer of carbon. Thereafter, they were examined using a Tescan EGATS5316 XMSEM (Tescan, Brno, Czech Republic) operated in BSE mode. Elemental composition of enamel was analysed with the aid of energy-dispersive X-ray spectroscopy (EDS). A Si(Li) detector (Oxford Instruments, Wiesbaden, Germany) served for recording EDS spectra using an accelerating voltage of 7 kV, a working distance of 23 mm, and a counting time of 100 s. For the quantitative analysis of these spectra, the Inca energy software (Oxford Instruments) was used.
7
Characterizing BSA-Loaded PLG Particles
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Scanning electron microscopy (SEM) is an electron optical imaging technique that yields both topographic images and elemental information. It is used in conjunction with energy-dispersive X-ray fluorescence (EDXRF). Therefore, in this work, SEM (JSM 5910 LV Scanning Electron Microscope, JEOL Ltd., Tokyo, Japan) attached with EDXRF (INCA Energy Software, Oxford Instruments, Abingdon, UK) was used to observe the morphology and chemical composition of the BSA encapsulated in the PLG particles, along with their particle diameters. Gold sputtering was used to make the encapsulated particles conductive for the SEM-EDXRF investigations.
In order to obtain additional structural information, FTIR in an attenuated (ATR) mode was used to confirm the presence of the BSA encapsulated in the PLG particles.
In order to obtain additional structural information, FTIR in an attenuated (ATR) mode was used to confirm the presence of the BSA encapsulated in the PLG particles.
8
Elemental Composition Analysis of Bioactive Glass
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Qualitative EDS analysis was used to study the elemental chemical composition of the bioactive glass discs, before and after the solubility tests were performed. All samples were sputter‐coated with carbon and analysed on a Jeol JSM6400 SEM equipped with an Oxford Instruments INCAx‐sight energy dispersive X‐ray spectrometer, operated at 20 kV. The EDS patterns generated were processed using the INCAEnergy software (Oxford Instruments, UK).
9
Scanning Electron Microscopy of Exosomes
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Small scaffold supports were fixed in 4% (v/v) paraformaldehyde and postfixed in 2% osmium tetroxide. After washing with 0.1 M phosphate buffer, the sample was dehydrated by a series of incubations in 30%, 50%, and 70% (v/v) ethanol. Dehydration was continued by incubation steps in 95% (v/v) ethanol, absolute ethanol, and acetone. Critical-point drying (Agar Scientific, ElektronTechnology UK Ltd) with supercritical CO2 was then performed to prevent cell deformation. Surfaces of the scaffolds were coated with gold and scanned using SEM LEO 1450VP (Carl Zeiss Meditec, Germany) [31 (link)]. EDX microanalysis was performed on exosome using a liquid N2-cooled Si detector with a super-ultrathin Be window. Spectra were collected by a SEM LEO 1450VP scanning electron microscope at acceleration voltage of 5 KeV employing an area scan mode (640 × 640 μm sampling area), 300 s acquisition time, and 32–37% detector dead time. Analysis of acquired spectra was performed under a nonstandard mode using atomic number-absorption-florescence correction (ZAF) methods using Inca Energy software (Oxford Instruments Ltd., High Wycombe, UK; Si(Li) detector, ATW—atmospheric thin window, resolution 133 eV for MnKα at 10000 counts).
10
Scanning Electron Microscopy Analysis of Film Cross-Sections
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The film cross sections were observed by scanning electron microscope (SEM-FEG HITACHI S-4800, Japan) equipped with energy dispersive X-ray spectroscopy (EDS)
and INCA energy software (Oxford Instrument). After embedded in epoxy resin, cross sections were mechanically polished with 9 µm diamond paste. A thin graphite layer was deposited on all samples prior to SEM examination.
The roughness of the samples was studied by an optical perfilometer. Different parameters have been evaluated: (i) the superficial average roughness, S a , (ii) the average height of the peaks, R h , and (iii) the S ku kurtosis parameter.
and INCA energy software (Oxford Instrument). After embedded in epoxy resin, cross sections were mechanically polished with 9 µm diamond paste. A thin graphite layer was deposited on all samples prior to SEM examination.
The roughness of the samples was studied by an optical perfilometer. Different parameters have been evaluated: (i) the superficial average roughness, S a , (ii) the average height of the peaks, R h , and (iii) the S ku kurtosis parameter.
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