The multi‐wavelength Raman spectra were carried out using a triple monochromator Raman spectrometer T64000 from Jobin‐Yvon Horiba company associated with Argon and Krypton gas lasers. It was possible to approach the Rayleigh line to within 20 cm−1 on both the Stokes and anti‐Stokes sides. The samples were sealed in a quartz cell with an inert atmosphere before cooling to avoid contact with moisture. The quartz cell was thermally connected to the cold finger using a thermal paste. The PI micro‐cryostat, able to monitor the sample temperature, was purged with N2 (without heating) and then, the sample was cooled to low temperature (≈ 77 K). In all cases, an objective with ×40 magnification and a laser power of typically less than 1 mW were used. The sample was systematically inspected optically confirming the absence of degradation.
T64000 raman spectrometer
Manufactured by Horiba
Sourced in Japan
The T64000 Raman spectrometer is a high-performance analytical instrument designed for Raman spectroscopy. It features a triple-stage monochromator and a highly sensitive CCD detector to provide accurate and reliable Raman measurements. The T64000 is capable of analyzing a wide range of materials and samples, making it a versatile tool for various scientific and industrial applications.
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Lab products found in correlation
S 4800, by Hitachi (1 mentions)
Tecnai 12, by Philips (1 mentions)
Zn no3 2 6h2o, by Merck Group (1 mentions)
Tg 50, by Shimadzu (1 mentions)
Coumarin 3 carboxylic acid, by Merck Group (1 mentions)
Differential scanning calorimeter, by TA Instruments (1 mentions)
Uv vis spectrophotometer, by Jasco (1 mentions)
Tecnai g2 f20 microscope, by Thermo Fisher Scientific (1 mentions)
X pert pro mrd diffractometer, by Malvern Panalytical (1 mentions)
Alpha 300r system, by WITec (1 mentions)
Tecnai f20, by Thermo Fisher Scientific (1 mentions)
Quanta 650 feg esem, by Thermo Fisher Scientific (1 mentions)
Magellan 400l, by Thermo Fisher Scientific (1 mentions)
Nanoscope 4 controller, by Veeco (1 mentions)
Jem 2100 tem model, by JEOL (1 mentions)
X pert pro powder diffractometer, by Malvern Panalytical (1 mentions)
16 protocols using t64000 raman spectrometer
1
Cryogenic Raman Spectroscopy of Samples
2
Synthesis and Characterization of Au Nanostructures
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The synthesis of Au NRs and Au@Ag NRs were monitored using UV-vis (L9, INESA, Shanghai, China). Transmission electron microscope (TEM) images were obtained with an electron microscope (Tecnai 12, Philips, Amsterdam, The Netherlands) operating at 120 kV. A high-speed centrifuge (2-16 PK, Sigma, Osterode, Germany) was used for sample purification. The original rigid platform framework was printed using a microscale 3D printing system with high-precision manufacturing capabilities (NanoArch P150, BMF, Chongqing, China). A scanning electron microscope (S4800, Hitachi, Tokyo, Japan) was employed to obtain the morphology of the cross-section of the hydrogel. SERS signals were collected with a Raman spectrometer (T64000, Horiba, Kyoto, Japan). A He-Ne laser with 633 nm radiation was used for excitation and the laser power at the sample position was 5 mW. All the spectra here were the result of an accumulation of 10 s.
3
Raman Spectroscopy of Single Crystal Silicon
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The Raman spectrometer T64000 (Horiba Jobin Yvon) with micro-Raman setup was used to record the Raman spectra. All experimental spectra were collected in the backscattering geometry using the 514.5 nm line of an Ar+ laser. The spectral resolution was not worse than 1.5 cm−1. The detector was a silicon-based CCD matrix, cooled with liquid nitrogen. The power of the laser beam reaching the sample was 2 mW. The band at 520.5 cm−1 of Si single crystal was used to calibrate the spectrometer.
4
Characterization of Zn(NO3)2.6H2O Complexes
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All chemicals Zn(NO 3 ) 2 .6H 2 O (Merck), coumarin-3-carboxylic acid (Fluka) and o-phenanthroline dihydrate (Sigma) were of analytical grade and used without further purification. Elemental analyses for carbon, nitrogen and hydrogen were performed using a Carlo Erba EA 1108 analyzer. FTIR spectra of powdered samples (as pressed KBr pellets) were measured with an Equinox 55 FTIR-spectrophotometer from 4000 to 400 cm -1 . The dispersive Raman spectra were collected on a Horiba-Jobin-Yvon T64000 Raman spectrometer, with a confocal microscope (10x objective) and CCD detection. A Kr laser with 647.1 nm of excitation wavelength and 500mW power was used. Calibration was performed using the 459 cm -1 band of CCl 4 . NMR spectra were acquired in a Bruker UltraShield 600 Plus, 14.1 Tesla with 1 H resonance of 600 MHz. Thermogravimetric measurement (TG) were performed on a Shimadzu system (model TG-50) working in an oxygen flow (50 mL min -1 ) at a heating rate of 10 o C min -1 .
Sample quantities ranged from 5 to 10 mg.
Sample quantities ranged from 5 to 10 mg.
5
Raman Spectroscopy of Material Samples
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Raman spectroscopy was performed on a Horiba-Jobin-Yvon T64000 Raman Spectrometer using a 514 nm laser operating at a power of 1 mW.
6
Raman Spectroscopy of Perovskite Films
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Raman spectroscopy measurements were performed on perovskite films fabricated on a quartz substrate. The Raman spectra were collected using a HORIBA T64000 Raman spectrometer attached to a confocal microscope with a 100× objective and a 532-nm laser for the excitation. Laser power was minimized to ensure that no degradation of the sample was induced. The spectra were recorded from 50 to 300 cm−1 and averaged over several accumulations. The samples were mounted on an Oxford Instruments MicrostatHiResII cryostat for temperature-dependent studies in the range of 10 to 300 K. The samples were cooled using a liquid helium cryostat while maintained at a vacuum of 10−6 mbar. Achieving significant signal-to-noise ratio while maintaining a sufficiently small laser intensity to avoid degradation of the sample was difficult at intermediate temperatures; hence, we only show here measurements at room temperature and low temperatures (100 K), where degradation induced peaks are not present (54 (link)).
7
Raman Spectroscopy of Thin Films
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Raman spectroscopy measurements were performed on films fabricated on a quartz substrate. The Raman spectra were collected using a HORIBA T64000 Raman spectrometer attached to a confocal microscope with a 100× objective and a 633 nm laser for the excitation. Laser power was minimized to ensure that no degradation of the sample was induced. The spectra were averaged over several accumulations.
8
Raman Spectroscopy of Thin Films
9
Comprehensive Characterization of Material Samples
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The crystallinity of
the sample was observed using a benchtop powder X-ray diffractometer
(Aeris Research, PANalytical, The Netherlands) with a scanning range
of 2θ = 10–90° with Cu Kα radiation (λ
= 1.540598 Å). Morphological parameters were evaluated from field
emission scanning electron microscopy (FESEM) images recorded on a
TESCAN MIRA3 LMH and high-resolution transmission electron microscopy
(HRTEM) data using a TALOS F200S G2 transmission electron microscope
(200 kV, FEG, CMOS Camera 4K × 4K). Raman spectra obtained from
a Horiba Jobin Yvon T64000 Raman spectrometer were used for phase
identification. Structural analysis was carried out using Fourier
transform infrared (FTIR) spectra in the region 400–4000 cm–1 obtained from an FTIR spectrometer (Thermo Nicolet,
USA) at room temperature. Thermal analysis was performed using a differential
scanning calorimeter (TA Instruments, Germany) in the temperature
range 30–600 °C at a heating rate of 10 °C/min. The
absorption spectra in the entire visible range were recorded on a
UV–vis spectrophotometer (Jasco, Japan). All fluorescence measurements
were recorded on a Fluorolog NIR spectrofluorometer (Horiba Jobin
Yvon, USA). Decay lifetimes were evaluated using a time-resolved Fluorimax
fluorimeter (Horiba Jobin Yvon, USA).
the sample was observed using a benchtop powder X-ray diffractometer
(Aeris Research, PANalytical, The Netherlands) with a scanning range
of 2θ = 10–90° with Cu Kα radiation (λ
= 1.540598 Å). Morphological parameters were evaluated from field
emission scanning electron microscopy (FESEM) images recorded on a
TESCAN MIRA3 LMH and high-resolution transmission electron microscopy
(HRTEM) data using a TALOS F200S G2 transmission electron microscope
(200 kV, FEG, CMOS Camera 4K × 4K). Raman spectra obtained from
a Horiba Jobin Yvon T64000 Raman spectrometer were used for phase
identification. Structural analysis was carried out using Fourier
transform infrared (FTIR) spectra in the region 400–4000 cm–1 obtained from an FTIR spectrometer (Thermo Nicolet,
USA) at room temperature. Thermal analysis was performed using a differential
scanning calorimeter (TA Instruments, Germany) in the temperature
range 30–600 °C at a heating rate of 10 °C/min. The
absorption spectra in the entire visible range were recorded on a
UV–vis spectrophotometer (Jasco, Japan). All fluorescence measurements
were recorded on a Fluorolog NIR spectrofluorometer (Horiba Jobin
Yvon, USA). Decay lifetimes were evaluated using a time-resolved Fluorimax
fluorimeter (Horiba Jobin Yvon, USA).
10
Comprehensive Characterization of Nanomaterials
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Powder XRD patterns were collected on a PANalytical X'pert Pro-MRD diffractometer with Cu K α radiation and PIXel detector. Scanning electron microscopy images were taken on a Quanta 650 FEG microscope. High-resolution transmission electron images (HR-TEM) and high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM) images were taken on a FEI Tecnai G2 F20 microscope. Raman measurements were performed on a Horiba T64000 Raman spectrometer. A 532 nm laser (Cobolt Samba) was used to obtain the spectra. XPS measurements were performed with a Phoibos 150 analyzer (SPECS GmbH, Berlin, Germany) under ultra-high vacuum conditions (based pressure 10 -10 mbar). Monochromatic Al Kα was used as X-ray source (1486.6 eV). All the high-resolution XPS spectra were fitted with CasaXPS version 2.3.1.
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