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15 protocols using vega 3 lmh

1

Morphological Analysis of PLA/PBS Foams

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PLA/PBS foams with or without PDLA were immersed in liquid nitrogen and then immediately fractured. The exposed surfaces were sputter coated with Au/Pd. Scanning electron microscopy (SEM, TESCAN (VEGA 3 LMH), ActipôleSt Charles, France) was used to investigate microcellular morphologies of the prepared foams. The SEM images were conducted using the software Image-Pro Plus to obtain the average cell size and cell density. The cell density Nf, defined as the number of cells per cubic centimeter of the foam, was calculated using the following equation [41 (link)]: Nf=[nM2A]32
where n is the number of cells, A is the area of the micrograph in cm2, and M is the magnification factor.
Transmission electron microscopy (TEM, FEI-Talos F200X, Hillsboro, OR, USA) was used to investigate the distribution of PBS droplets in the PLLA matrix. The extruded sample was cut into 100 nm thick sample pieces then the thin pieces were placed on the copper network, finally the phase distribution was observed at 200 KV voltage.
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2

Characterization of Cathode Deposits

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To determine the phase and elemental composition of cathode deposits, an X-ray diffractometer D2 PHAZER (Bruker, Bremen, Germany); scanning electron microscope Tescan VEGA3LMH, which allows quantitative EDX chemical analysis (Tescan, Brno—Kohoutovice, Czech Republic); and X-ray fluorescent spectrometer Spektrscan MAKS GV (Spectron, St. Petersburg, Russia) were used.
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3

Structural Analysis of Copper-Adsorbed Hydrogel

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An FTIR spectrometer (Nicolet 510, Durham, NH, USA) was used to analyze the chemical structure of the obtained hydrogel. An SEM instrument (VEGA 3 LMH, TESCAN, Brno, Czech) was used to observe the morphology of the hydrogel. XPS (Axis Ultra, Kratos Analytical Ltd., Stretford, UK) with an Al Kα X-ray source (1486.71 eV of photons) was also used to analyze the composite hydrogel with adsorbed copper(II) ions. All binding energies used the neutral C 1s peak at 284.6 eV as a reference to compensate for the surface charging effects.
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4

Scanning Electron Microscopy and Energy-Dispersive X-ray Analysis

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Scanning electron microscopy (SEM) and energy-dispersive X-ray
spectroscopy (EDS)
The analysis of scanning electron microscopy and the energy dispersive X-ray
spectroscopy were performed in an electron microscope (Tescan, Vega3 LMH, Czech
Republic) operated at 30 kV. The dried sample was attached in a carbon
double-faced tape supported in a metallic stub. The sample was sputtered with
gold (Q150RS, Quorum Technologies Ltda., UK). The morphology was evaluated by
SEM and the magnification, voltage, and resolution are described in each image.
The composition was determined by EDS using the same equipment with an attached
analyzer (Oxford Instruments, UK).
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5

Ceramic-Polymer Composition Characterization

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Phase identification of ceramic-polymer compositions was carried out by X-ray Dif-fraction in an Empyrean diffractometer (PANalytical, Almelo, The Netherlands) with radiation source Cu–Kα (λ = 1.5405981 Å) operated with an intensity of 30 mA at 40 kV in the 2θ angle range from 10 to 70°. The analysis was carried out with a scanning speed of 0.06/min and a step size of 0.05. The microstructure and powder morphology of the initial powders as well as elemental composition of obtained filaments were studied using a scanning electron microscope (SEM) VEGA 3 LMH (Tescan, Brno, Czech Republic) equipped with a module for energy dispersive X-ray spectroscopy (EDS) analysis. The diameter of the obtained filaments and the spatial dimensions of the printed samples were measured with an absolute digimatic caliper 100 (Mitutoyo, Kawasaki Japan). The study of the relief of the filament surface was carried out on a stereomicroscope SZ61 (Olympus, Tokyo, Japan), and the roughness values were obtained on a desktop SEM G2 Pro X (Phenom, Eindhoven, The Netherlands).
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6

Comprehensive Structural Analysis of Materials

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Structural and morphological properties were examined by (i) X-ray diffraction measurements (Bruker D8 Advance, λ = 1.542 Å), (ii) Raman spectroscopy (laser wavelength λ = 473.1 nm), (iii) X-ray photoelectronic spectrometry (model: VG Escalab 220i XL, Al Kα 1,2 polychromatic source = 1486.6 eV), (iv) scanning electron microscopy (Tescan Vega3 LMH) and (v) transmission electron microscopy (model: JEM 2100 F, 200 kV). The porosity was evaluated by nitrogen adsorption–desorption measurements (relative pressure P/P0: from 0.0 to 1.0) using the Brunauer–Emmett–Teller analysis (BET: Quantachrome), and the specific surface area was determined by BET theory. The electrochemical study was performed using a Biologic VMP 300 instrument, reference electrode (Ag/AgCl: 3 M KCl saturated), and platinum plate counter electrode.
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7

Characterization of Synthesized Samples

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Fourier transform infrared spectroscopy (FT-IR) was performed on a Nicolet Fourier transform infrared spectrometer (USA). The dried sample was ground into powder and mixed with KBr, and then compressed into thin pellet form before being tested. The X-ray photoelectron spectroscopy (XPS) was carried out on a Thermo ESCALAB 250 with Al Kα X-rays. C 1s binding energy value of 284.8 eV was used as standard correcting the observed spectra to eliminate sample charging effects. The surface morphologies of the synthesized samples were observed by a scanning electron microscope (SEM, TESCAN VEGA3 LMH). The sample swollen to equilibrium in phosphate buffer solution (pH = 7.4, I = 0.1) at 37 °C for 24 h was frozen at −20 °C, and then freeze-dried at −50 °C. After the obtained sample was sprayed with gold, it was placed in an SEM to observe the morphology.
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8

Multimodal Material Characterization

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Scanning electron microscopy (SEM) images were obtained by a VEGA 3 LMH (TESCAN, Brno, Czech Republic) with an accelerating voltage of 20 kV. The elemental composition distribution was determined using a scanning electron microscope equipped with energy dispersive spectrometry (EDS) (INCA X-ACT, Oxford Instruments, Abingdon, UK). Fourier-transform infrared (FTIR) spectra were recorded with a Bruker Tensor 27 spectrometer (Bruker, Billerica, MA, USA) at a resolution of 2 cm−1. The surface chemical analysis was performed with X-ray photo-electron spectroscopy (XPS, Kratos Analytical, Manchester, UK). The apparent contact angle was measured with the pendent drop method (JC2000D4 Powereach Tensionmeter, Shanghai Zhongchen Digital Technology Equipment Co., Ltd., Shanghai, China).
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9

SEM Characterization of Materials

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The SEM measurements were conducted utilizing a Tescan Vega 3 LMH instrument. The SEM operated at an accelerating voltage of 20 kV and employed a secondary electron detector (SE). Additionally, the SEM was equipped with energy dispersive spectroscopy (EDS) capabilities. To enhance the conductivity of the materials, they were initially carbon-coated using the Agar Turbo Carbon coater.
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10

Characterization of Gray Cast Iron

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The chemical compositions of the as-received gray cast iron was determined using spark emission spectrometer. The pulverised organic carbon was characterised using transmission electron microscope (TEM) at 200 nm to study the morphology and the crystalline structure. More so, the phase compositions of each organic carbon was studied using X-ray diffractometer (XRD). A Tescan Vega 3LMH scanning electron microscope with an accelerating voltage of 20kV, beam intensity of 17 W/m2 and the scanning speed of 10μs/pixel was used to check the morphology of each carburised sample. Also, the phase composition of the carburised substrate (gray cast iron) were equally determined using Rigaku Miniflex 600 powder diffractometer, which is equipped with Cu ka radiation source generated at 18 kW and 250 mA. The XRD spectra were obtained at room temperature.
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