Di nanoscope multi mode 5 system

TEM and EDS were analyzed for microstructure and composition on the JEM-2100F electron microscope operated at 200 kV. STEM and element mapping scanning were obtained on field-emission Magellan 400 microscope under the FEI Company. XRD pattern was recorded on a Rigaku D/MAX-2200 PC XRD system. XPS spectrum was recorded on ESCAlab250 (Thermal Scientific). DLS and Zeta potential were tested on Zetasizer Nanoseries (Nano ZS90, Malvern Instrument Ltd.). AFM images were collected on the Veeco DI Nanoscope Multi Mode V system. UV-vis-NIR absorption spectra were recorded on UV-3101 Shimadzu UV-vis-NIR spectrometer. FTIR pattern was recorded for the analysis of chemical bonds. The quantitative analysis of Fe element was conducted on inductively coupled plasma-optical emission spectrometry (ICP-OES, Agilent 725, Agilent Technologies). Raman spectroscopy pattern was collected on a DXR Raman microscope (Thermal Scientific, USA). ESR spectrum was measured using DMPO as the nitrogen trapping agent by Bruker EMX1598 spectrometer.

Scanning electron microscopy (SEM) images were obtained with a Zeiss Supra 40 scanning electron microscope at an acceleration voltage of 5 kV. The transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM) observations were performed with a Hitachi H-7650 microscope at 100 kV and a JEOL ARM-200F transmission electron microscope at 200 kV, respectively. Energy dispersive spectroscopy (EDS), electron energy loss spectroscopy (EELS) and energy filtered transmission electron microscopy (EFTEM) were carried out on a JEOL ARM-200F transmission electron microscope. XRD patterns were recorded on a PW1710 instrument with CuKα radiation λ = 0.15406 nm. XPS spectra were obtained with an ESCALab MKII X-ray photoelectron spectrometer using a Mg Kα radiation excitation source. UV-vis spectra were recorded on a UV-2501PC/2550 spectrometer (Shimadzu Corp., Japan) at room temperature. The infrared spectra were measured on a NICOLET Fourier transform infrared spectrometer, using pressed KBr tablets. The atomic force microscopy study in the present work was performed using a Veeco DI Nano-scope MultiMode V system. The BET measurements were determined using Micromeritics ASAP-2000 nitrogen adsorption apparatus. Raman spectra were obtained with a confocal laser microRaman spectrometer (LABRAM-HR, JY Co.).