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X ray photoelectron spectroscopy

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X-ray photoelectron spectroscopy (XPS) is a surface-sensitive analytical technique that provides information about the elemental composition, chemical state, and electronic state of the materials being analyzed. It uses X-rays to irradiate the sample surface and measure the energy of the emitted photoelectrons, which is characteristic of the elements present in the sample.

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13 protocols using x ray photoelectron spectroscopy

1

Microstructural and Optical Analysis of Materials

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The field emission scanning electron microscopy (SEM) and transmission electron microscopy (TEM) were carried out in order to observe the microstructure and morphology of the samples. The chemical composition of the samples was carried out by X-ray photoelectron spectroscopy (Thermo Fisher Scientific, Waltham, MA, USA) and was also recorded. Brunauer–Emmett–Teller (BET) were characterized in order to measure the pore volume, surface area, and pore distribution. The crystal phase and structure of the as-fabricated samples were utilized with a powder X-ray diffractometer (Bruker D8 Advance, USA) applying Cu Ka radiation (k = 0.154168 nm). The optical spectra were recorded by a UV–Vis reflectance spectrophotometer (Hitachi U-4100, Japan.) and photoluminescence (PL). The photochemical property was determined using an electrochemical workstation with a 0.2-M Na2SO4 solution as the electrolyte. Electron spin resonance (ESR) signals of the radicals captured were performed with visible light activity on a Bruker A300 spectrometer.
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2

Characterization of Mn3O4@rGO Nanocomposites

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Typical X-ray diffraction patterns of rGO, Mn3O4 and Mn3O4@rGO composites are analyzed using an X-ray diffractometer (Bruker D8) with Cu Kα radiation (λ = 1.5406 Å) between 10 and 80° at a scan rate of 5° min−1. Resonant Raman scattering spectra are recorded using a Renishaw inVia laser Raman microscope with an excitation wavelength (λ) of 633 nm (He–Ne laser). Scanning electron microscopy (VEGA3 SB, TESCAN Instruments) and transmission electron microscopy (HRTEM, JEOLJEM 2100) are used to investigate the morphology and microstructure of the synthesized materials. The chemical states of the synthesized nanocomposite are investigated using X-ray photoelectron spectroscopy (Thermo Fisher Scientific Instruments UK) with a monochromatic Al Kα source (1486.6 eV), and the obtained results are calibrated by reference with C 1s at 284.6 eV. The surface areas of the synthesized materials are investigated using nitrogen adsorption–desorption isotherms which are recorded at 77 K on a Micromeritics ASAP 2020.
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3

Characterization of Hybrid Perovskite Materials

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For crystal-phase composition analysis, the XRD patterns of FA and MFA were obtained via the D8 focus powder diffractometer (Bruker, Germany) using Cu Kα radiation with the tube voltage of 40 kV and tube current of 40 mA. Data was obtained at an increment of 0.019° and the scanning speed of 5 degrees s−1. The quantitative phase analysis was performed by the Rietveld method using the Topas5.0 software package. Moreover, the micro-morphology of the fractured surface of MFA was investigated via the Nova Nano SEM450 field-emission electron microscope (FESEM) obtained from FEI using an acceleration voltage of 1.00 kV. An FTIR spectrum was obtained by the Tensor27 Fourier-transform infrared spectrometer (Bruker, Germany) using thin films prepared on KBr. Lastly, the element and valence of FA and MFA were analyzed by X-ray photoelectron spectroscopy (Thermofisher, America) using Al Kα radiation with a full-spectrum pass energy of 100.0 eV, step size of 1.00 eV, narrow-spectrum pass energy of 30.0 eV, step length of 0.05 eV, and a binding energy that was corrected based on the binding energy of C 1s (binding energy = 284.8 eV).
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4

XPS Analysis of PoLfs Fiber

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The atomic concentration of the PoLfs fiber was measured using an X-ray photoelectron spectroscopy (Thermo Fisher Scientific Inc., East Grinstead, UK) apparatus that had the characteristics of a monochromatic Al-Ka (1486.7 eV) X-ray source and a 300 µm diameter beam. The range used to gather XPS data was 1361–10 eV, with a precision of 0.1 eV and pass energy of 50 eV. Ionic Ar gas was sputtered before the fiber sample was examined on the surface, and 10 scans were made from a single spot to collect the data.
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5

Comprehensive Materials Characterization

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Optical microscope (Motic, Xiamen, China) was used to characterize the morphology. Material composition was characterized by X-ray photoelectron spectroscopy (XPS) (Thermo Fisher, Waltham, MA, USA). X-ray diffraction (XRD) (Bruker, Bilerika, MA, USA) and high-resolution transmission electron microscopy (HRTEM) (FEI, Hillsboro, OR, USA) were applied to characterize microstructure. The electric and photoelectric properties were studied on a four-probe table (SEMISHARE, Shenzhen, China) combined with the 2636B source meter (KEITHLEY, Cleveland, OH, USA). For this, 365, 405, 532, 808, and 1550 nm lasers were applied as the probing light sources.
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6

Comprehensive Characterization of Synthesized Catalysts

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The synthesized catalysts were analyzed for structural information using an X-ray diffractometer (Panalytical’s X’Pert Pro, Malvern, UK) with a Cukα radiation source. The experiments were performed in the 2θ scanning range of 20–70 degrees with step size of 0.02°. The particle size of catalysts was obtained with the help of a transmission electron microscope (EM-410 LS, Philips, Amsterdam, The Netherlands). The surface morphology of the catalysts was examined using a scanning electron microscope (SEM, Hitachi, Tokyo, Japan). X-ray photoelectron spectroscopy (Thermofisher Scientific, Nexsa base, Waltham, MA, USA) was employed for the determination of elemental presence and their valence states. The metal-stretching vibrations in the synthesized catalysts were performed with the help of a Raman spectrometer (Raman Horiba, Lab RAM HR evolution). The bandgap estimation was performed by analysis of the absorbance spectra recorded using a UV-VIS-NIR spectrophotometer (Perkin Elmer, Waltham, MA, USA). The magnetic properties of the catalysts were investigated using a vibrating sample magnetometer (Micrösense, EV7) to record the room temperature M-H loop at a field strength of 15,000 Oe. Photoluminescence (PL) spectra were recorded on a FS5 spectrophotometer (Edinburgh Instruments, Edinburgh, UK).
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7

Characterization of SnO2 Nanopores and Cu2O NPs

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The samples were
analyzed by field emission scanning electron microscopy (FESEM, JSM-IT800,
Joel, Japan) for morphology, and elemental composition was measured
using an energy-dispersive X-ray (EDX) detector attached with FESEM.
Transmission electron microscopy (TEM) (Techni G2 F30, FEI, USA) was
utilized to find out crystallinity and size of SnO2 nanopores
and Cu2O NPs. The purity and crystallinity of the pristine
nanostructures were determined using high-resolution powdered X-ray
diffraction (Smart Lab, D/tex, Rigaku Japan) equipped with a Cu Kα1
radiation of 1.54056 Å. The crystallinity of the hybrid structure
was checked by high-resolution thin-film XRD (Smart Lab, Hypix 3000,
Rigaku Japan) equipped with a Cu Kα radiation of 1.54056 Å.
The crystal structure of the fabricated samples was also found out
by Raman microscopy (Lab RAM HR, Horiba Jobin Yvon, France) equipped
with a charge-coupled device (CCD) detector. X-ray photoelectron spectroscopy
(Thermo Scientific USA) with Al Kα radiation as the excitation
source was utilized to check the oxidation state and chemical composition
of the samples. Optical properties of the samples were studied using
a UV–visible spectrophotometer (Lambda 1050 PerkinElmer USA).
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8

Comprehensive Electrochemical and Spectroscopic Analysis

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Differential pulse voltammetry (DPV), cyclic voltammetry (CV) and electrochemical impedance spectroscopy (EIS) were measured by a CHI 660D-electrochemical workstation (Chenhua Instruments Co., Ltd., Shanghai, China). Transmission electron microscopy imaging (TEM) was obtained by a JEM-2100 transmission electron microscope (JEOL Co., Ltd., Japan), Scanning electron microscopy (SEM) and element energy spectrum analysis were carried out by a quanta-200 scanning electron microscope (Hitachi Science Systems Co., Ltd Japan). X-ray photoelectron spectroscopy (Thermo Fisher Scientific Co., Ltd., Shanghai, China) was used to obtain the XRD patterns. The electrochemical detection in the experiment was carried out using a three-electrode system, in which the glassy carbon electrode was the working electrode, the saturated calomel electrode was the reference electrode, and the platinum electrode was the counter electrode.
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9

Comprehensive Characterization of Synthesized WNWs

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The morphology of the as-synthesized WNW and interlayers was investigated using scanning electron microscopy (SEM; Nova NanoSEM 450, FEI, Hillsboro, OR, USA) and transmission electron microscopy (TEM; JEM-2100F, JEOL, Tokyo, Japan). The crystal structures of the obtained products were characterized by X-ray diffractometry (MiniFlex600, Rigaku, Japan) using Cu Kα radiation. The surface area and pore size distribution of the WNWs were measured using a Quantachrome Autosorb iQ MP automated gas adsorption system with liquid nitrogen (at 77 K). X-ray photoelectron spectroscopy (XPS; Thermo Fisher Scientific, Waltham, MA, USA) was used to investigate the surface and chemical states of the WNWs; the binding energy values were calibrated based on the C 1s peak at 284.5 eV.
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10

Comprehensive Structural and Chemical Characterization of Materials

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The structural features of as-prepared materials were analyzed by powder X-ray diffraction (X-ray diffractometer model XRD-6100, Shimadzu, Kyoto, Japan) with CuKα X-ray radiation (λ = 0.15406 nm). The morphological features were examined by scanning electron microscopy (FESEM, Hitachi, S-4800 and HRTEM, Tecnai G2 F20 S-Twin at an accelerating voltage of 200 kV). The elements of active materials were recognized using energy-dispersive X-ray spectroscopy (EDS) attached to the SEM. Sample mappings were obtained using annular dark-field imaging in a scanning transmission electron microscope (STEM) equipped with a high-angle annular dark field (HAADF) detector. The chemical states of the materials were tested using a Thermo Scientific X-ray photoelectron spectroscopy (XPS) instrument utilizing Al Kα radiation (λ = 1486.6 eV). The Brunauer–Emmett–Teller (BET) specific surface area was examined by N2 adsorption-desorption measurements in a Micromeritics ASAP 2420 surface area analyzer. The samples were evacuated at 150 °C before the N2 adsorption test. The BET surface area was estimated by the multipoint BET method based on the adsorption data in the P/P0 range of 0.0–1.0, where P and P0 correspond to the equilibrium and saturation pressures of the adsorbates at the temperature of adsorption, respectively.
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