X ray photoelectron spectroscopy
X-ray photoelectron spectroscopy (XPS) is a surface-sensitive analytical technique that provides information about the elemental composition, chemical state, and electronic state of the materials being analyzed. It uses X-rays to irradiate the sample surface and measure the energy of the emitted photoelectrons, which is characteristic of the elements present in the sample.
Lab products found in correlation
13 protocols using x ray photoelectron spectroscopy
Microstructural and Optical Analysis of Materials
Characterization of Mn3O4@rGO Nanocomposites
Characterization of Hybrid Perovskite Materials
XPS Analysis of PoLfs Fiber
Comprehensive Materials Characterization
Comprehensive Characterization of Synthesized Catalysts
Characterization of SnO2 Nanopores and Cu2O NPs
analyzed by field emission scanning electron microscopy (FESEM, JSM-IT800,
Joel, Japan) for morphology, and elemental composition was measured
using an energy-dispersive X-ray (EDX) detector attached with FESEM.
Transmission electron microscopy (TEM) (Techni G2 F30, FEI, USA) was
utilized to find out crystallinity and size of SnO2 nanopores
and Cu2O NPs. The purity and crystallinity of the pristine
nanostructures were determined using high-resolution powdered X-ray
diffraction (Smart Lab, D/tex, Rigaku Japan) equipped with a Cu Kα1
radiation of 1.54056 Å. The crystallinity of the hybrid structure
was checked by high-resolution thin-film XRD (Smart Lab, Hypix 3000,
Rigaku Japan) equipped with a Cu Kα radiation of 1.54056 Å.
The crystal structure of the fabricated samples was also found out
by Raman microscopy (Lab RAM HR, Horiba Jobin Yvon, France) equipped
with a charge-coupled device (CCD) detector. X-ray photoelectron spectroscopy
(Thermo Scientific USA) with Al Kα radiation as the excitation
source was utilized to check the oxidation state and chemical composition
of the samples. Optical properties of the samples were studied using
a UV–visible spectrophotometer (Lambda 1050 PerkinElmer USA).
Comprehensive Electrochemical and Spectroscopic Analysis
Comprehensive Characterization of Synthesized WNWs
Comprehensive Structural and Chemical Characterization of Materials
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