Cryo-EM micrographs were acquired at −180°C on a FEI CETA 4k × 4k CMOS camera by the same FEI F200C TEM operating at 200-kV and low-electron-dose conditions. Selected-area electron diffraction (SAED) images were taken with a ∼350 nm diameter selected-area (SA) aperture. The exposure time was varied between 0.2 and 1 s.
F200c tem
The F200C TEM is a transmission electron microscope manufactured by Thermo Fisher Scientific. It is designed to provide high-resolution imaging and analysis of micro- and nano-scale samples. The F200C TEM utilizes an electron beam to magnify and focus the image of a specimen, enabling researchers to study the structure and composition of materials at the atomic level.
2 protocols using f200c tem
Characterization of Nanomaterials by TEM
Cryo-EM micrographs were acquired at −180°C on a FEI CETA 4k × 4k CMOS camera by the same FEI F200C TEM operating at 200-kV and low-electron-dose conditions. Selected-area electron diffraction (SAED) images were taken with a ∼350 nm diameter selected-area (SA) aperture. The exposure time was varied between 0.2 and 1 s.
Comprehensive Characterization of Novel Materials
1H-NMR spectra were obtained on an Ascend™ 400 spectrometer at room temperature. The solvent in measurement was deuterated chloroform. GPC measurements were carried out at room temperature on a PL-GPC 220 using THF as eluent at a flow rate of 1ml/min at room temperature. MALDI-TOF mass measurements were performed on a Bruker autoflex III smartbeam MALDI-TOF/TOF mass spectrometer using 2-[(2E)-3-(4-tert-butylphenyl)-2-methylprop-2-enylidene] malononitrile (DCTB) as matrix. UV-vis spectra were recorded using a Lambda 35 UV-vis spectrometer. FT-IR spectra were obtained on a Nicolet 6700 FT-IR spectrometer. The PL measurement was performed on a QM40 spectrometer. The recycling preparative liquid chromatography is LC-9104. The flow rate was 12 ml/min. Ultrasound treatment was performed on a 20 kHz KC-D40A ultrasonic cleaner at 12–18°C. TEM was performed on a HITACHI HT 7700 electron microscope operating at 95kV accelerating voltage. XRD analysis was performed on a SMARTLAB(3) diffractometer. Cryo-TEM image was obtained at a FEI Talos F200C TEM.
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