Jem 2100 scanning electron microscope
The JEM-2100 is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to produce high-resolution images of the surface topography and composition of a wide range of samples. The JEM-2100 utilizes an electron beam to scan the specimen, and the interactions between the electrons and the sample surface are detected and used to create an image.
Lab products found in correlation
2 protocols using jem 2100 scanning electron microscope
Ultrastructural Analysis of African Catfish Stomach
Catalyst Characterization by XRD, SEM, and BET
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