Su 8010

The single-crystal x-ray diffraction was performed on a Bruker D8 diffractometer with Mo Kα radiation. PXRD measurements were conducted on a Rigaku MiniFlex II diffractometer. Scanning electron microscopy images were collected on an SU 8010 field-emission scanning electron microscope, which was operated at 3 kV. The absorption spectra of MAPbBr₃, (4-AMP)(MA)₂Pb₃Br₁₀, and heterostructure were measured on the Perkin-Elmer Lambda 900 UV–Vis–NIR spectra photometer. The emission decay dynamics were monitored by FLS980’s single-photon counting capability (1024 channels; 1 μs window). For temperature-dependent photoluminescence emission measurements, the samples were kept in a liquid nitrogen cryostat, and the temperature was collected from 310 to 77 K using a temperature controller.

The presence of crystalline structures and composition of the tandem structures were identified using X-Ray Diffraction analysis using a Rigaku Miniflex X-Ray diffractometer containing a Cu K_α source (I = 1.54 Å, 40 kV, 100 mA). The morphology investigations were done by field emission scanning electron microscopy (FESEM, SU8010), operated at an accelerated voltage of 25 kV. The optical properties (absorbance and reflectance) necessary to evaluate the film thickness and the band gap were investigated using a UV-Vis spectrometer (PerkinElmer Lambda 25 UV/Vis).