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S4500 field emission sem

Manufactured by Hitachi
Sourced in Japan, United Kingdom

The S4500 field emission scanning electron microscope (FE-SEM) is a high-performance imaging tool designed for advanced materials analysis. It utilizes a field emission source to generate a focused electron beam, enabling high-resolution imaging and analysis of a wide range of samples.

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6 protocols using s4500 field emission sem

1

Particle Size and Surface Morphology Analysis

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Hitachi S-4500 field emission SEM equipped with a Quartz PCI XOne SSD X-ray analyzer (Hitachi Ltd., Tokyo, Japan) was used to determine the particle size and surface morphology of B-nCu0 and B-nCu0W particles. Samples were prepared by sprinkling solid samples onto adhesive carbon tape supported on a metallic disk and examined at 10 kV accelerating voltage. EDX was used in conjunction with SEM to determine the elemental composition of the particles by randomly selecting areas on the solid surface.
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2

Developmental Analysis of Cochlear Hair Cell Bundle Morphology

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To evaluate the 3D bundle morphology during development, we examined mouse cochlear hair cells at different developmental stages. Cochleae of CD/1 mice aged P0 to P10 were anaesthetised with an overdose of sodium pentobarbitone (IP; Pentoject, Animalcare Ltd, York), decapitated, the cochleae removed and fixed through holes in the round window and the apex, with 2.5% glutaraldehyde (GTA) in 0.1 sodium cacodylate buffer (NaCac) for 2 h. They were dissected into spirals, post-fixed in 1% OsO4/NaCac and then osmium-thiocarbohydrazide impregnated using the OTOTO technique [3 (link),18 (link)]. They were subsequently dehydrated through an ethanol series and critical point dried from liquid CO2, before being mounted on sticky carbon pads onto SEM stubs. Where necessary, to reduce charging, the specimens were further grounded using silver colloid paint (Agar Scientific) and examined in a Hitachi S4500 field emission SEM operated at 5kV. We did not use gold-labelling with backscattered electron detection for SEM because preliminary results showed that much of the labelling was located developmentally in the lower part of the bundle, between stereocilia, and therefore not accessible to observation in an SEM.
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3

SEM Imaging of Aged Mouse Cochleae

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For SEM, cochleae were excised from aged C57BL/6N mice (15 months). They were fixed by intralabyrinthine perfusion using a fine hypodermic needle through the round window with 2.5% vol/vol glutaraldehyde in 0.1M sodium cacodylate buffer containing 2 mM calcium chloride (pH 7.4) and then immersed in this fixative for 2 hrs. They were stored in fixative diluted 1/10th in buffer and subsequently dissected by removing the bone from the apical coil to expose the organ of Corti and then immersed in 1% osmium tetroxide in the cacodylate buffer for 1 h. For osmium impregnation, which avoids gold coating, cochleae were incubated in solutions of saturated aqueous thiocarbohydrazide (20 mins) alternating with 1% osmium tetroxide in buffer (2 h) twice (the OTOTO technique (Furness & Hackney, 1986 (link)). They were dehydrated through an ethanol series and critical point dried using CO2 as the transitional fluid, then mounted on specimen stubs using conductive silver paint (Agar Scientific, Stansted, UK) and examined in a Hitachi S4500 field emission SEM operated at 5 kV accelerating voltage.
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4

Electrochemical Characterization of Al-based Energy Storage

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All electrochemical measurements were performed using a lab-built glass cell.9 (link) A mixture of aluminum chloride, dipropylsulfone (DPSO2), and toluene (1 : 10 : 5 molar ratio) served as the electrolyte solution. A Mo plate (1.3 cm × 1.3 cm), which was used as the current collector, was immersed in conc. HCl for several seconds before use. An Al plate (10 mm in diameter, 0.2 mm in thickness) was used as the counter and reference electrodes in all electrochemical experiments. A glass fiber filter (Advantec, Ltd.) was used as the separator. A test cell was assembled in an Ar-filled glovebox. Cyclic voltammetry and charge/discharge tests were performed at 30 °C using an SI1287 potentiostat (Solartron) and an HJ1001SM8 charge/discharge system (Hokuto Denko), respectively. X-ray diffraction (XRD) spectra were measured by an X-ray diffractometer (50 kV, 30 mA; XRD-6100, Shimadzu) equipped with a Cu Kα source (λ = 0.1541 nm). Scanning electron microscope (SEM) images and energy-dispersive X-ray analysis (EDX) were performed with an S-4500 field-emission SEM (Hitachi) and EDAX system (Ametec), respectively.
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5

Ultrastructural Analysis of Mouse Cochleae

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Cochleae of P3 and P18 mice were excised from the temporal bone and fixed by perfusion as described above using 2.5% glutaraldehyde in 0.1 M sodium cacodylate buffer containing 2 mM calcium chloride and incubation for 2 h. They were stored in 1/10th fixative until further processing. For postfixation, the samples were washed in sodium cacodylate buffer and then immersed in 1% osmium tetroxide in sodium cacodylate for 1 h.
For SEM, cochleae were dissected and then prepared using the OTOTO technique73 (link). Briefly, segments were incubated in alternating solutions of osmium tetroxide (3X, 2 h) and saturated thiocarbohydrazide (2X, 20 mins) with six washes in water between each change. They were subsequently dehydrated through an ethanol series and critical point dried using a Polaron drier, mounted on platinum stubs using adhesive carbon pads, and examined in a Hitachi S4500 field emission SEM at 5 kV.
For TEM, samples were fixed and dehydrated as for SEM, but then embedded in Spurr’s resin73 (link), sectioned at 70–100 nm and the sections collected on copper grids. Grids were stained in uranyl acetate and lead citrate and examined in a JEOL 100 S TEM. Images were recorded on Acros Neopan 35 mm negatives and digitized using a HP Canonscan 9000 negative scanner.
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6

Electron Microscopy Characterization of SIS Particles

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The SIS particles were scattered onto aluminum SEM stubs and sputter coated with either 5 nm thick gold-palladium 30mA for 30second or 4.5 nm thick iridium 30mA for 30 seconds using a K575X sputter coater (EMITECH, Quorum). Images were acquired with Hitachi S-4500 field emission SEM and processed using Quartz PCI (v9) software. Size quantification from 9 separate images with multiple fields of view was manually conducted by blinded observers at the NCI Frederick EM facility (Electron Microscopy Laboratory).
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