S4500 field emission sem
The S4500 field emission scanning electron microscope (FE-SEM) is a high-performance imaging tool designed for advanced materials analysis. It utilizes a field emission source to generate a focused electron beam, enabling high-resolution imaging and analysis of a wide range of samples.
6 protocols using s4500 field emission sem
Particle Size and Surface Morphology Analysis
Developmental Analysis of Cochlear Hair Cell Bundle Morphology
SEM Imaging of Aged Mouse Cochleae
Electrochemical Characterization of Al-based Energy Storage
Ultrastructural Analysis of Mouse Cochleae
For SEM, cochleae were dissected and then prepared using the OTOTO technique73 (link). Briefly, segments were incubated in alternating solutions of osmium tetroxide (3X, 2 h) and saturated thiocarbohydrazide (2X, 20 mins) with six washes in water between each change. They were subsequently dehydrated through an ethanol series and critical point dried using a Polaron drier, mounted on platinum stubs using adhesive carbon pads, and examined in a Hitachi S4500 field emission SEM at 5 kV.
For TEM, samples were fixed and dehydrated as for SEM, but then embedded in Spurr’s resin73 (link), sectioned at 70–100 nm and the sections collected on copper grids. Grids were stained in uranyl acetate and lead citrate and examined in a JEOL 100 S TEM. Images were recorded on Acros Neopan 35 mm negatives and digitized using a HP Canonscan 9000 negative scanner.
Electron Microscopy Characterization of SIS Particles
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