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Supernova system

Manufactured by Agilent Technologies

The SuperNova system is a high-performance analytical instrument designed for laboratory use. It is capable of performing advanced spectroscopic analysis and measurements. The core function of the SuperNova system is to provide accurate and reliable data for scientific research and testing applications.

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3 protocols using supernova system

1

Powder X-ray Diffraction Analysis

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The nature of selected raw materials and dry powders were assessed through powder X-ray diffraction collected on Agilent Technologies Supernova system using Cu Kα (λ = 1.54184 Å) radiation. The powder was finely milled before being mounted on a nylon loop in a small amount of paratone-N oil. The data were recorded at 2θ from 5° to 35° with a step size of 0.010°. CrysAlis Pro software (version 1.171.35.15) was used to analyze all the data.
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2

Single-Crystal X-ray Diffraction Protocol

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The diffraction data of all compounds
were collected on an Agilent Technologies SuperNova system and an
X-ray single-crystal diffractometer with Cu Kα radiation (λ
= 1.54184 Å) at 100 K. The data were processed using CrysAlisPro.51 All structures were solved
and refined using full-matrix least-squares based on F2 with ShelXT and ShelXLwithin Olex2 programs.52 (link)−54 (link)
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3

X-ray Diffraction Analysis of Au11 Nanoclusters

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The X-ray diffraction intensities were collected for selected single crystals nanocluster [Au11(PPh3)8(CCPh–CF3)2](SbF6) using an Agilent Technologies SuperNova system. X-ray single-crystal diffractometer using Cu Kα (λ = 1.54184 Å) at 100 K. The data were processed using CrysAlisPro.61 The structure was solved and refined using Full-matrix least-squares based on F2 using ShelXT,62 ShelXL63 (link) in Olex2 (ref. 64 ) and Shelxle.65 (link) Almost all hydrogen atoms were located from difference Fourier maps and those not found were added at theoretical positions using the riding model. Further details can be obtained from the cif files deposited at the Cambridge Crystallographic Data Centre. The CCDC reference number is 2127378. The thermal elipsoids of the ORTEP diagram at 50% probability is shown in Fig. S2. Detailed crystal data and structure refinements are summarized in Table S1.
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