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Xcaliber eos gemini diffractometerabsorption

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The Xcaliber Eos Gemini diffractometer is a laboratory instrument designed for X-ray diffraction analysis. It is used to identify and quantify the crystalline phases present in a sample. The instrument generates X-rays, which interact with the sample's crystal structure, and the resulting diffraction pattern is analyzed to provide information about the sample's composition and structure.

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Lab products found in correlation

Crysalis pro, by Agilent Technologies (6 mentions)

Spelling variants of this product

Eos Gemini diffractometerAbsorption (40 citations) Gemini diffractometerAbsorption (4 citations) Eos diffractometerAbsorption (2 citations) Gemini EOS (2 citations)

6 protocols using xcaliber eos gemini diffractometerabsorption

1

Single Crystal X-ray Diffraction Protocol

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Oxford Diffraction Xcaliber Eos Gemini diffractometer

Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2011 ▸ ) Tmin = 0.774, Tmax = 1.000

8463 measured reflections

2830 independent reflections

2506 reflections with I > 2σ(I)

Rint = 0.023

Ramli S.B., Ravoof T.B., Tahir M.I, & Tiekink E.R. (2015). Crystal structure of 4-methyl­benzyl N′-[(thio­phen-2-yl)methyl­idene]hydrazinecarbodi­thio­ate. Acta Crystallographica Section E: Crystallographic Communications, 71(Pt 7), o475-o476.
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2

Single Crystal X-ray Diffraction

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Oxford Diffraction Xcaliber Eos Gemini diffractometer

Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2011 ▸ ) Tmin = 0.715, Tmax = 1.000

40860 measured reflections

4248 independent reflections

3956 reflections with I > 2σ(I)

Rint = 0.033

Yusof E.N., Ravoof T.B., Tahir M.I, & Tiekink E.R. (2015). Crystal structure of 2-((1E)-{2-[bis­(2-methyl­benzyl­sulfan­yl)methyl­idene]hydrazin-1-yl­idene}meth­yl)-6-meth­oxy­phenol. Acta Crystallographica Section E: Crystallographic Communications, 71(Pt 4), o242-o243.
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3

Single-Crystal X-Ray Diffraction Analysis

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Oxford Diffraction Xcaliber Eos Gemini diffractometer

Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2011 ▸ ) Tmin = 0.860, Tmax = 1.000

14591 measured reflections

2160 independent reflections

2044 reflections with I > 2σ(I)

Rint = 0.022

Mokhtaruddin N.S., Ravoof T.B., Tahir M.I, & Tiekink E.R. (2015). Crystal structure of 3-methyl­pyridine-2-carbaldehyde 4-methyl­thio­semi­carba­zone monohydrate. Acta Crystallographica Section E: Crystallographic Communications, 71(Pt 4), o253-o254.
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4

Single-crystal X-ray Diffraction Analysis

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Oxford Diffraction Xcaliber Eos Gemini diffractometer

Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2011 ▸ ) Tmin = 0.923, Tmax = 1.000

8119 measured reflections

2408 independent reflections

2187 reflections with I > 2σ(I)

Rint = 0.026

Jamsari J., Abas N.F., Ravoof T.B, & Tiekink E.R. (2015). Crystal structure of 2′-hy­droxy­aceto­phenone 4-methyl­thio­semicarbazide. Acta Crystallographica Section E: Crystallographic Communications, 71(Pt 4), o244-o245.
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5

Gemini Diffractometer Structural Analysis

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Oxford Diffraction Xcaliber Eos Gemini diffractometer

Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2011 ▸ ) Tmin = 0.700, Tmax = 1.000

18486 measured reflections

2784 independent reflections

2616 reflections with I > 2σ(I)

Rint = 0.022

Aziz N.A., Yusof E.N., Ravoof T.B, & Tiekink E.R. (2015). Crystal structure of benzyl 3-(3-methyl­phen­yl)di­thio­carbazate. Acta Crystallographica Section E: Crystallographic Communications, 71(Pt 4), o233-o234.
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6

Single Crystal X-ray Diffraction Analysis

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Agilent Xcaliber Eos Gemini diffractometer

Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2011 ▶ ) Tmin = 0.80, Tmax = 0.96

5463 measured reflections

2460 independent reflections

2327 reflections with I > 2σ(I)

Rint = 0.022

Low M.L., Ravoof T.B., Tahir M.I., Crouse K.A, & Tiekink E.R. (2014). Crystal structure of 2-{[2-(3-phenyl­allyl­idene)hydrazin-1-yl]thio­carbonyl­sulfanylmeth­yl}pyridinium chloride. Acta Crystallographica Section E: Structure Reports Online, 70(Pt 11), o1207-o1208.
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