AFM was performed using a Digital Instruments Nanoscope III Scanning Probe Microscope (Digital Instruments, CA, USA) under ambient conditions (22 °C, 45–55% relative humidity) over areas measuring 10 μm × 10 μm. The bacterial cellulose and gelatin based-hydrogel composites were prepared in the form of a thin, flat sheet. The instrument was equipped with a silicon nitride tip and operated in the lateral contact mode. The measurements were repeated five times for comparable topological analysis.
Nanoscope 3 scanning probe microscope
Manufactured by Digital Instruments
Sourced in United States
The Nanoscope III Scanning Probe Microscope is a laboratory instrument designed for high-resolution imaging and analysis of surface topography at the nanoscale level. It utilizes scanning probe microscopy techniques to capture detailed topographical data of samples with a high degree of precision.
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Lab products found in correlation
3 protocols using nanoscope 3 scanning probe microscope
1
AFM Characterization of Cellulose-Gelatin Hydrogels
2
Hierarchical Superhydrophobic Surfaces Characterization
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SEM images were
taken using a JEOL
FESEM 6700F electron microscope with a primary electron energy of
3 kV. The substrates were sputter-coated with a 5 nm layer of Pt prior
to taking images. The thickness of the PNIPAAm film was measured by
using a Dektak 150 surface profiler (Veeco). Atomic force microscopy
(AFM) images were recorded in the tapping mode with a Nanoscope III
scanning probe microscope from Digital Instruments. The optical microscopy
image was taken by an OLYMPUS BX51. X-ray photoelectron spectroscopy
(XPS) was characterized by using an ESCALAB 250 spectrometer with
a mono X-ray source Al Ka excitation (1486.6 eV). The oil (1,2-dichloroethane)
contact angles underwater were investigated using Dataphysics OCA20.
A 5 μL oil droplet was deposited onto the samples immersed in
water, and the static contact angle (CA) was employed as the indicator
to evaluate the wettability of the hierarchical structures, as determined
by the average value, which was measured at least three times at different
positions on each sample. The water CA was measured with a 5 μL
of water droplet deposited onto the samples in the air.
taken using a JEOL
FESEM 6700F electron microscope with a primary electron energy of
3 kV. The substrates were sputter-coated with a 5 nm layer of Pt prior
to taking images. The thickness of the PNIPAAm film was measured by
using a Dektak 150 surface profiler (Veeco). Atomic force microscopy
(AFM) images were recorded in the tapping mode with a Nanoscope III
scanning probe microscope from Digital Instruments. The optical microscopy
image was taken by an OLYMPUS BX51. X-ray photoelectron spectroscopy
(XPS) was characterized by using an ESCALAB 250 spectrometer with
a mono X-ray source Al Ka excitation (1486.6 eV). The oil (1,2-dichloroethane)
contact angles underwater were investigated using Dataphysics OCA20.
A 5 μL oil droplet was deposited onto the samples immersed in
water, and the static contact angle (CA) was employed as the indicator
to evaluate the wettability of the hierarchical structures, as determined
by the average value, which was measured at least three times at different
positions on each sample. The water CA was measured with a 5 μL
of water droplet deposited onto the samples in the air.
3
Topographical Analysis of Materials by AFM
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Atomic force microscopy (AFM) images were collected using a Digital Instruments Nanoscope III scanning probe Microscope (Digital Instruments, CA). The instrument was equipped with a silicon tip (RTESP-300 Bruker) and operated in tapping mode. Surface topographical analysis of AFM images was carried out with NanoScope analysis 1.5
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