Su1510
The SU1510 is a scanning electron microscope (SEM) produced by Hitachi. It is designed to provide high-resolution images of samples by scanning the surface with a focused beam of electrons. The SU1510 is capable of magnifying samples up to 300,000 times, allowing for detailed analysis of surface features and compositions.
Lab products found in correlation
160 protocols using su1510
Scanning Electron Microscopy of Hydrogels
Physicochemical Characterization of Micro/Nanoparticles
MPs/NPs morphology was investigated by SEM technique. SEM images were recorded with a HITACHI SU 1510 (Hitachi SU-1510, Hitachi Company, Tokyo, Japan) Scanning Electron Microscope. MP/NPs were fixed on an Aluminum stub and coated with a 7 nm thick gold layer using a Cressington 108 device before observation.
MPs/NPs’ mean diameter and size distribution were analyzed by laser diffractometry technique (SHIMADZU SALD 7001). MPs/NPs (3 mg) were immersed in acetone and sonicated for 15 min at room temperature using a sonication bath (Bandelin Sonorex). MPs/NPs suspension was added in a quartz cuvette equipped with a stirring mechanism and analyzed. All measurements were performed in triplicate.
MPs/NPs’ Zeta potential was analyzed with Zetasizer Nano ZS Series from Malvern. For sample preparation, MPs/NPs were dispersed in distilled water at a mass concentration of 1.25 g/L and sonicated for 1 min. Zeta potential measurements were performed at 25 °C.
Hydrogel Surface Morphology Analysis
Investigating Hydrogel Surface and Cross-Section Morphology
Yacón Leaf Ultrastructure Analysis
Comprehensive Characterization of PCP-1C
Analyzing Resin-Dentin Bond Failure Modes
Surface Characterization of Titanium Disks
Examination with an atomic force microscope (AFM; Nanosurf Easyscan 2, Nanosurf, AG, Liestal, Switzerland) revealed the three-dimensional surface morphology and surface roughness (Sa) of the surface-modified disk specimens. AFM images were captured in air. The scans were obtained in the dynamic force mode with a tapping cantilever (Tap 190 Al-G, Budget Sensors; Innovative Solutions Bulgaria Ltd., Sofia, Bulgaria). AFM images were obtained for an area of 25 × 25 µm2. Surface roughness was measured as the three-dimensional arithmetic height (Sa) value obtained from the captured images on AFM analysis. Three specimens for each condition were measured.
Contact angles for each specimen with respect to double-distilled water were measured using a contact angle meter (DMe-201; Kyowa Interface Science Co. Ltd., Tokyo, Japan). The volume of the water drops was maintained at 1.0 µL, and 10 s measurements of each surface were made thrice under controlled conditions of 25 ± 1 °C and 46% humidity.
SEM Characterization of EPS Micro-structures
Scanning Electron Microscopy of Bacillus coccoides
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