D8 quest
The D8 Quest is a versatile X-ray diffractometer designed for a wide range of applications. It features a high-performance, air-cooled X-ray source and a state-of-the-art 2D detector, providing efficient data collection and analysis.
Lab products found in correlation
98 protocols using d8 quest
Multi-Technique Material Characterization
Comprehensive Material Characterization
X-ray Diffraction Analysis of Crystallographic Complexes
Characterization of FAPbI3 Single Crystals
Nuclear Magnetic Resonance and X-ray Diffraction Analysis
Safety. Organic peroxides are potentially hazardous compounds (inflammable and explosive) and must be handled carefully: (1) a safety shield should be used for all reactions involving H2O2; (2) direct exposure to strong heat or light, mechanical shock, oxidizable organic materials, or transition-metal ions should be avoided.
Single-Crystal XRD Analysis of Compound 1
The detailed crystallographic data and selected bond lengths as well as the bond angles for compound 1 are listed in
Glycine-Sulfamic Acid Cocrystal Structure
of the glycine–sulfamic acid 2:1 ionic cocrystal was determined
at −100 °C on a Bruker D8 Quest fixed-χ single-crystal
diffractometer equipped with a sealed-tube X-ray source that delivers
Mo Kα (λ = 0.71073 Å), a TRIUMPH monochromator, a
PHOTON 100 detector, and a nitrogen-flow Oxford Cryosystem attachment.
Unit cell determination, data reduction, and absorption correction
(multiscan method) were conducted using the Bruker APEX3 suite.31 Using Olex2,32 (link) the
structure was solved with the ShelXT structure solution program33 (link) using intrinsic phasing and refined with the
ShelXL refinement package34 (link) using least-squares
minimization.
Comprehensive Analytical Characterization
Single Crystal X-Ray Diffraction Analysis
Crystalline Structure Characterization of Synthesized Nanoparticles
of the synthesized NPs was carried out on a Bruker D8 QUEST single
crystal diffractometer recorded using Cu Kαλ = 1.5418
Å radiation at room temperature (300 K). Frames were collected
via ω/φ scans and then processed to obtain diffractograms
of intensity vs 2θ between 30 and 90°. The HighScore
Plus software was used for raw data treatment, and a database associated
with the software was implemented for the search-match phase identification
analyses.
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