For SEM analysis, samples were fixed with 2.5% glutaraldehyde for 1 h at room temperature, washed in distilled water, and subjected to a series of ethanol dehydration steps for 10 min each. Subsequently, the samples were critical point dried, sputter coated with gold/palladium, and observed under SEM (FEI Helios Nanolab™ 660 DualBeam™) (N = 6). The elemental analysis for the presence of Ca and P was carried out using the attached EDX detector (INCA, Oxford Instruments) (N = 4).
Helios nanolab 660 dualbeam
Manufactured by Thermo Fisher Scientific
The Helios Nanolab™ 660 DualBeam™ is a high-performance focused ion beam (FIB) and scanning electron microscope (SEM) system designed for advanced materials characterization and sample preparation. It combines a high-resolution SEM and a precise FIB column to enable targeted site-specific analysis and modification of samples.
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Lab products found in correlation
3 protocols using helios nanolab 660 dualbeam
1
SEM Analysis of Dehydrated Samples
2
Visualizing Vaterite Helicoid Structures
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To detect the inner structure and height changes in vaterite helicoids having different chiralities (clockwise or counterclockwise direction) or different symmetries (achiral transitional straight-radiating or horizontal-surrounding platelet orientation), we also prepared SEM samples of cross sections of helicoids using a Helios NanoLab 660 DualBeam (FEI Company) using conventional FIB techniques. All samples were coated with 3-nm platinum layer to enhance electrical conductivity. To prevent ion beam damages on the surface of helicoids during the process of FIB milling, we deposited a protective layer of platinum (2-μm thickness) onto the specimen surface in the selected area. Material surrounding the region of interest was removed using a 30-kV ion beam and a current ranging from 65 to 2.5 nA. To exclude a perfectly flat surface resulting from FIB cutting and milling, and to allow for some topography to be visualized, the samples were briefly etched with phosphoric acid (pH 4) 3 × 20 s, then were rinsed with triple distilled water and ethanol, and allowed to dry in a vacuum desiccator at room temperature before SEM investigation.
3
Microscopic Analysis of Nanomaterials
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Transmission electron microscopy (TEM) was performed with a JOEL 2100 F at a voltage of 200 kV in TEM mode. The high angle angular dark field-scanning transmission electron microscope (HAADF-STEM) images were collected by the FEI Titan Themis3 (link) S/TEM operated at an accelerating voltage of 300 kV with a double tilt holder. Scanning electron microscope (SEM) images were collected with a FEI Helios NanoLab 660 Dual Beam with working voltage of 5 kV, working current of 25 pA, and working distance of 4 mm.
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