Q500 system
The Q500 is a thermal analysis system designed for measuring the physical and chemical properties of materials. It provides precise and reliable measurements of properties such as weight change, heat flow, and temperature over a wide range of temperatures. The Q500 is a versatile instrument suitable for a variety of applications in research, development, and quality control.
Lab products found in correlation
5 protocols using q500 system
Multimodal Characterization of Novel Materials
Characterization of Poly(4-Vinylguaiacol) Polymers
Structural and Thermal Analysis of Materials
X’Pert-Pro diffractometer using monochromatic Cu Kα radiation
(40 mA, 40 kV) with a step width of 0.013° (2θ). JCPDS
cards were used to identify the crystalline phases. Transmission electron
microscopy (TEM) images of composite samples were recorded using a
TEM/STEM JEOL JEM 2200 fs microscope operating at 200 kV. Prior to
TEM analysis, powders of the sample were prepared and dispersed in
water and a drop of the finely dispersed sample was put on a Lacey
Carbon film copper TEM grid. The TEM grid with the sample droplet
was dried overnight in an oven at 40 °C. Fifty particles at random
locations were analyzed by Image J to determine the particle size
and distribution. HRTEM images were used to determine the lattice
plane distance using the Image J software. Thermogravimetric analysis
(TGA) was carried out to study the thermal behavior of the prepared
materials using a Q500 system from TA Instrument (New Castle, DE);
the samples were heated from 50 to 700 °C at 10 °C/min in
nitrogen or air (gas flow of 60 mL/min). The tests were performed
by placing about 10 mg of the sample in open alumina pans.
Comprehensive Material Characterization
(XRD) pattern was recorded with a New D8 Advance X-ray diffractometer
(Bruker, USA) using Cu Kα radiation. Fourier-transform infrared
(FT-IR) spectra were acquired on a Nicolet iS10 IR spectrophotometer
(Thermo Fisher Scientific, USA) with the sample in potassium bromide
pellets. Thermogravimetric analysis (TGA) was conducted using a Q500
system (TA Instruments, USA) at a scan rate of 5 °C min–1 under an air atmosphere. The nitrogen adsorption–desorption
isotherm was obtained using a 3Flex surface characterization analyzer
(Micromeritics, USA) at −196 °C. The sample was vacuum-dried
at 100 °C overnight prior to analysis. Field-emission scanning
electron microscopy (FE-SEM) photographs were obtained on a SUPRA
55VP field-emission scanning electron microscope (Zeiss, Germany).
Zeta potential was evaluated using a Z-1000 electrophoretic light
scattering spectrophotometer (ELS, Otsuka Electronics, Japan).
Characterizing Photovoltaic Materials using XRD, TGA, and SEM
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!