Fei titan3 g2 60 300

We analyze the surface morphologies of P-SC Ti_nO_2n−1 samples using field-emission scanning electron microscope (FE-SEM) (Zeiss Auriga) at an accelerating voltage of 10 KV. The phase formation is then examined using XRD on an X-ray diffractmeter (Cu-Kα, Mniflex 600). We use FIB (ZeissAuriga) to prepare TEM samples and then characterize them on a Cs-TEM (FEI Titan3 G2 60–300) at 300 kV. The valence of Ti in P-SC Ti_nO_2n-1 crystals is determined using XPS on ESCALAB 250Xi. The transport properties are investigated at a physical property measurement system 9 (PPMS-9) at 300 K. We use femtosecond transient absorption spectrometer (355 nm excitation, Helios) and transient fluorescence spectrometer (375 nm excitation, FLS980) the analyze the excition dynamics under irradiation. We use the HS-LEIS spectra (ION-TOF, Qtac100) with 3 keV He⁺ (6 nA) and 5 keV Ne⁺ (3 nA) ion sources to analyze the atomic termination layer on porous crystals. Raman spectra of the P-SC Ti_nO_2n-1 crystals are recorded on Horiba Labram HR Evolution. Nitrogen adsorption measurements are performed at 77 K using a Micromeritics ASAP 2020C + M system utilizing Brunauer–Emmett–Teller (BET) calculations for surface area and mean pore size. Surface chemical analysis is performed by XPS (Thermal Fisher Inc., ESCALAB 250Xi). The ESR spectra were recorded on a Bruker Biospin GMBH E500 10/12 ESR spectrometer.

X-ray diffraction (XRD, Empyrean, PANalytical) was used to study the crystal structure of the InP NCs. The size and shape of the NCs were determined by spherical aberration-corrected TEM (JEOL, JEM-ARM 200 F) with an acceleration voltage of 200 kV at the National NanoFab Center, Republic of Korea. High-resolution TEM images (Figs. 2c–e and 5b, d and Supplementary Figs. 3–5) were taken by spherical aberration-corrected TEM (FEI Titan3 G2 60–300) with an acceleration voltage of 80 kV at Ulsan National Institute of Science and Technology (UNIST). To obtain high signal-to-noise ratio images, we used a single layer of graphene as a supporting film for TEM imaging. As the NCs could be damaged by the e-beam during TEM measurement at high magnification, we evaluated the arm length and width of the tetrapods with low-magnification images⁵⁹ .