The images of 041 were obtained by transmission electron microscopy of the negatively-stained samples, as described in [26 (link)]. A total of 10 µL (0.2 mg/mL) of the sample solution was directly applied on the carbon-coated nickel grid (Agar Scientific, Essex, UK), and the excess liquid was drained with filter paper before staining with two successive drops of 2% uranyl acetate (pH 4.5). The prepared sample was dried and examined with a Morgagni 268(D) transmission electron microscope (FEI, Hillsboro, OR, USA).
Carbon coated nickel grid
Manufactured by Agar Scientific
Sourced in United Kingdom
Carbon-coated nickel grid is a type of lab equipment used in electron microscopy. It provides a conductive support for samples being imaged. The carbon coating helps to minimize charging effects during imaging.
Automatically generated - may contain errors
7 protocols using carbon coated nickel grid
1
Negative Staining Transmission Electron Microscopy
2
Phage Particle Visualization via TEM
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The CsCl density gradient-purified phage particles were diluted to approximately 1011 PFU/mL with distilled water, 5 mL of the sample was directly applied on the carbon-coated nickel grid (Agar Scientific, Essex, UK), the excess liquid was drained with filter paper before staining with two successive drops of 2% uranyl acetate (pH 4.5), dried, and examined in Tecnai G2 F20 X-TWIN transmission electron microscope (FEI, Hillsboro, OR, USA).
3
Phage Particle Visualization via TEM
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The CsCl density gradient-purified phage particles were diluted to approximately 1011 PFU/mL with distilled water, and 10 µL of the sample was directly applied on the carbon-coated nickel grid (Agar Scientific, Essex, UK). After 1 min, the excess liquid was drained with filter paper and stained with two successive drops of 2% uranyl acetate (pH 4.5) for 1 min. The sample then was dried and examined using a Tecnai G2 F20 X-TWIN transmission electron microscope (FEI, Hillsboro, OR, USA).
4
Negative Staining Transmission Electron Microscopy
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The images of gp053 were obtained by transmission electron microscopy of the negatively-stained samples. Approximately 10 µL of the diluted sample solution was directly applied on the carbon-coated nickel grid (Agar Scientific, Essex, UK), and the excess liquid was drained with filter paper before staining with two successive drops of 2% uranyl acetate (pH 4.5). The prepared sample was dried and examined with a Morgagni 268(D) transmission electron microscope (FEI, Hillsboro, OR, USA).
5
Phage particle visualisation by TEM
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The CsCl density gradient-purified phage particles were diluted to approximately 1011 PFU/mL with distilled water, 10 µL of the sample was directly applied on the carbon-coated nickel grid (Agar Scientific, Essex, UK), drained with filter paper, stained with two successive drops of 2% uranyl acetate (pH 4.5), dried, and examined in Tecnai G2 F20 X-TWIN transmission electron microscope (FEI, Hillsboro, OR, USA).
6
Phage Particle Visualization by TEM
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The CsCl density gradient-purified phage particles were diluted to approximately 1010–1011 PFU/mL with distilled water, and 10 µL of the sample was directly applied onto the carbon-coated nickel grid (Agar Scientific, Essex, UK). After 1 min, the excess liquid was drained with filter paper and stained with two successive drops of 2% uranyl acetate (pH 4.5) for 1 min. The sample was then dried and examined using a Tecnai G2 F20 X-TWIN transmission electron microscope (FEI, Hillsboro, OR, USA).
7
Phage Particle Visualization by TEM
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The CsCl density gradient-purified phage particles were diluted to approximately 1011 PFU/mL with distilled water, and 10 µL of the sample was directly applied on the carbon-coated nickel grid (Agar Scientific, Essex, UK). After 1 min, the excess liquid was drained with filter paper and stained with two successive drops of 2% uranyl acetate (pH 4.5) for 1 min. The sample was then dried and examined using a Tecnai G2 F20 X-TWIN transmission electron microscope (FEI, Hillsboro, OR, USA). The magnification value was valid for TEM monitor only, as it was depended on the screen size, zooming, or printed micrograph dimensions.
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