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Xl feg sem

Manufactured by Philips

The XL FEG SEM is a field emission gun scanning electron microscope (FEG SEM) from Philips. It provides high-resolution imaging and analysis capabilities for a wide range of materials and applications.

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2 protocols using xl feg sem

1

Scanning Electron Microscopy of 4HPR Particles

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The morphology of 4HPR, 4HPR-PVP particles, and millicylinder cross sections were examined by scanning electron microscopy (SEM) using a Phillips XL FEG SEM. All samples were completely dried, sputter coated with gold for 90 sec, and images obtained with a 3 kV electron beam.
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2

Morphological Analysis of Millicylinders

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The morphology of millicylinders was examined by scanning electron microscopy (SEM) using a Phillips XL FEG SEM. The millicylinders were dried, sputter coated with gold for 90 s, then imaged using a 3 kV electric beam. Cross section and surfaces of millicylinders were imaged and inspected qualitatively for discrete 4HPR crystals throughout the polymer matrix. When this happens, it is indicative that the drug has precipitated during millicylinder formation, and the drug solubility limit in the polymer has been exceeded.
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