Ntegra scanning probe microscope
The NTEGRA scanning probe microscope is a versatile instrument designed for high-resolution imaging and analysis of surface topography and material properties. It utilizes a variety of scanning probe techniques, including atomic force microscopy (AFM), scanning tunneling microscopy (STM), and near-field scanning optical microscopy (NSOM), to investigate samples at the nanoscale level. The NTEGRA provides researchers and scientists with a powerful tool for advanced materials characterization and surface analysis.
Lab products found in correlation
6 protocols using ntegra scanning probe microscope
Atomic Force Microscopy of Peptide-Metal Interactions
Characterization of XG-based Hydrogel Surfaces
Cryogel Surface Topography Analysis
Surface Characterization of Polyphenol-Loaded Hydrogels
Tapping Mode AFM Imaging Protocol
Nanoscale Characterization of Surfaces
Fourier Transformed Infrared Spectroscopy in the Attenuated Total Reflection (FTIR-ATR) measurements have been recorded at 4 cm−1 resolution with 140 scans recording, using an IR Tracer-100 FT-IR spectrometer (Shimadzu Corporation, Japan) equipped with a GladeATR module (PIKE Technologies, Madison, WI, USA). For each sample, the evaluations were made on the average spectrum obtained from three recordings. Background and sample spectra were obtained in the 400 to 4000 cm−1 wavenumber range.
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