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Ntegra scanning probe microscope

Manufactured by NT-MDT

The NTEGRA scanning probe microscope is a versatile instrument designed for high-resolution imaging and analysis of surface topography and material properties. It utilizes a variety of scanning probe techniques, including atomic force microscopy (AFM), scanning tunneling microscopy (STM), and near-field scanning optical microscopy (NSOM), to investigate samples at the nanoscale level. The NTEGRA provides researchers and scientists with a powerful tool for advanced materials characterization and surface analysis.

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6 protocols using ntegra scanning probe microscope

1

Atomic Force Microscopy of Peptide-Metal Interactions

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AFM experiments were carried out at a 1:10 peptide: metal molar ratio. In total, 5 μL of each sample was deposited onto a 1 × 1 cm cleaved mica surface and allowed to dry for 24 h at RT covered by a Petri dish to avoid dust. The surface images were obtained with an NTEGRA scanning probe microscope (NT-MDT Spectrum Instruments, Moscow, Russia), in AFM configuration. Rectangular silicon cantilevers NSG10 (NT-MDT, Moscow, Russia) with tips of high aspect ratio (sharpened pyramidal tip, angle of nearly 20°, tip curvature radius of 10 nm and height of 14–16 µm) were used in order to minimize convolution effects. All images were acquired in air, at RT, in tapping mode, with the velocity of 6 mm/s. For image acquisition, the Nova v.19891 for Solver software was used. All AFM images were obtained at a resolution of 256 × 256 pixels on a scale of 20 µm × 20 µm.
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2

Characterization of XG-based Hydrogel Surfaces

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The 2D and 3D surface images for the XG-based hydrogels were collected using a NTEGRA scanning probe microscope (NT-MDT Spectrum Instruments, Moscow, Russia) in atomic force microscopy (AFM) configuration. Rectangular silicon cantilevers NSG 03 (NT-MDT, Russia) with tips of height aspect ratio were used to scan the film surfaces. The AFM images and the surface parameters were processed and calculated using Nova v.19891 for Solver Software [55 (link)].
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3

Cryogel Surface Topography Analysis

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The surface topographical features of the obtained cryogels based on PVA and PEBSA copolymacrolactone were investigated by AFM, in atmospheric conditions, at room temperature using an NTEGRA Scanning Probe Microscope from NT-MDT Spectrum Instruments (Moscow, Russia). The resonance frequency of the NSG10 cantilever utilized in tapping mode was 241 kHz. Nova 1.0.26.1443 and Image Analysis 3.5.0.19892 software were employed for data acquisition and to calculate the 3D roughness parameters on the 10 × 10 µm2 selected images.
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4

Surface Characterization of Polyphenol-Loaded Hydrogels

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A NTEGRA scanning probe microscope (NT-MDT Spectrum Instruments, Moscow, Russia), in atomic force microscopy (AFM) configuration, was used to collect the 2D and 3D surface images for the polyphenol-loaded XG/PVA composite hydrogel films. The film surfaces were scanned using rectangular silicon cantilevers NSG 03 (NT-MDT, Russia) having tips of equal height and aspect ratio. The Nova v.19891 for Solver software was used to process the AFM images and calculate the surface parameters [76 (link)].
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5

Tapping Mode AFM Imaging Protocol

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The AFM scans are done in a NTEGRA scanning probe microscope from NT-MDT with a Smena measuring head. The scans are performed in tapping mode with typical parameters of a driven frequency of 340 Hz, a magnitude of 10 nA, a set point of 5 nA and scan speed of 10–30 μm s−1.
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6

Nanoscale Characterization of Surfaces

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Atomic force microscopy (AFM) surface images were obtained with a NTEGRA scanning probe microscope (NT-MDT Spectrum Instruments, Moscow, Russia). Rectangular silicon cantilevers NSG11 (NT-MDT, Russia) with two different tips of high aspect ratio (sharpened pyramidal tip, angle of nearly 20°, tip curvature radius of 10 nm and height of 10–15 µm) were used in order to minimize convolution effects. Here, we used the shorter (100 ± 5 µm) of those two. For sample preparation, 5 µL of the solutions were dropped onto the freshly cleaved mica surface and allowed to dry for 24 h at RT. All images were acquired in air, at room temperature (23 °C), in tapping mode, with the velocity of 6 mm/s. For image acquisition, the Nova v.19891 for Solver software was used.
Fourier Transformed Infrared Spectroscopy in the Attenuated Total Reflection (FTIR-ATR) measurements have been recorded at 4 cm−1 resolution with 140 scans recording, using an IR Tracer-100 FT-IR spectrometer (Shimadzu Corporation, Japan) equipped with a GladeATR module (PIKE Technologies, Madison, WI, USA). For each sample, the evaluations were made on the average spectrum obtained from three recordings. Background and sample spectra were obtained in the 400 to 4000 cm−1 wavenumber range.
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