S4700 field emission scanning electron microscope sem
The Hitachi S4700 is a field emission scanning electron microscope (SEM) designed for high-resolution imaging and analysis of materials. The S4700 SEM uses a field emission electron source to generate a focused electron beam, which is then scanned across the sample surface to create an image. The instrument is capable of producing high-resolution images with low accelerating voltages, making it suitable for the examination of delicate or sensitive samples.
Lab products found in correlation
2 protocols using s4700 field emission scanning electron microscope sem
High-Pressure Homogenized Nanoformulated CAB for Drug Delivery
High-Pressure Homogenized Nanoformulated CAB for Drug Delivery
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!