Orius sc600 ccd camera
The ORIUS SC600 CCD camera is a high-performance, scientific-grade imaging device designed for various laboratory applications. It features a large-format CCD sensor with high-resolution capabilities and high quantum efficiency, enabling efficient light detection and capture. The camera provides a versatile interface and advanced data acquisition capabilities to support a wide range of imaging and analysis tasks.
Lab products found in correlation
10 protocols using orius sc600 ccd camera
Transmission Electron Microscopy of Extracellular Vesicles
High-Resolution TEM Characterization
Microstructural Analysis via Electron Microscopy
images were taken using a ZEISS FE-SEM ULTRA PLUS applying its in-lens
secondary electron detector at an accelerating voltage of 2 kV. The
microstructure of the samples was studied by transmission electron
microscopy (TEM) with a TECNAI F20 field emission electron microscope
operated at an accelerating voltage of 200 kV. Images were recorded
with a Gatan Orius SC600 CCD camera.
Nanoparticle Size and Charge Characterization
Transmission Electron Microscopy of MDRSA
Multifunctional Nanocomposite Characterization
Ultrastructural Analysis of Tetracycline-Induced TbUMSBP Knockdown
Electron Microscopy of Purified Rod-B Proteins
Multimodal Microscopic Characterization
microscopy was performed at a 5 kV acceleration voltage on a Supra
55 VP instrument by Carl Zeiss AG (Oberkochen, Germany) equipped with
an EDX detector after sputter coating the samples with 5 nm of gold
using an EM QSG 100 instrument by Leica Camera AG (Wetzlar, Germany).
Transmission electron microscopy was performed at a 20 kV acceleration
voltage on a CM200 system by Philips GmbH (Vienna, Austria) equipped
with an Orius SC600 CCD camera by Gatan GmbH (Munich, Germany). Carbon
film coated copper grids (200 mesh) were obtained from Plano GmbH
(Marburg, Germany). SEM samples were spotted onto 13 mm Nunc Thermanox
cell culture coverslips from Thermo Fisher Scientific GmbH (Vienna,
Austria). Atomic force micrographs were recorded on a Park NX10 instrument
by Park Systems Corp. (Suwon, South Korea) using a silicon tip with
a nominal radius below 10 nm operating in tapping mode.
Characterization of Nanoparticle Size and Charge
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